Subjects: MATÉRIA CONDENSADA, FÍSICA DA MATÉRIA CONDENSADA
ABNT
BUNK, Oliver et al. Structure determination of the indium-induced Si(111)-(4X1) reconstruction by surface x-ray diffraction. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: http://publica-sbi.if.usp.br/PDFs/pd1442.pdf. Acesso em: 30 set. 2024. , 1999APA
Bunk, O., Falkenberg, G., Zeysing, J. H., Lottermoser, L., Johnson, R. L., Nielsen, M., et al. (1999). Structure determination of the indium-induced Si(111)-(4X1) reconstruction by surface x-ray diffraction. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de http://publica-sbi.if.usp.br/PDFs/pd1442.pdfNLM
Bunk O, Falkenberg G, Zeysing JH, Lottermoser L, Johnson RL, Nielsen M, Berg-Rasmussen F, Baker J, Feidenhans'l R. Structure determination of the indium-induced Si(111)-(4X1) reconstruction by surface x-ray diffraction [Internet]. 1999 ;[citado 2024 set. 30 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd1442.pdfVancouver
Bunk O, Falkenberg G, Zeysing JH, Lottermoser L, Johnson RL, Nielsen M, Berg-Rasmussen F, Baker J, Feidenhans'l R. Structure determination of the indium-induced Si(111)-(4X1) reconstruction by surface x-ray diffraction [Internet]. 1999 ;[citado 2024 set. 30 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd1442.pdf