Atomic force microscope nanolithography of polymethylmethacrylate polymer (2007)
Teixeira, Fernanda de Sá; Mansano, Ronaldo Domingues 
; Salvadori, Maria Cecília Barbosa da Silveira; Cattani, Mauro Sérgio Dorsa ; Brown, I G
Fonte: Review of Scientific Instruments. Unidades: EP, IF
Assuntos: MICROSCOPIA ELETRÔNICA DE VARREDURA, POLÍMEROS (MATERIAIS)
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TEIXEIRA, Fernanda de Sá et al. Atomic force microscope nanolithography of polymethylmethacrylate polymer. Review of Scientific Instruments, v. 78, n. 4, p. 053702-053702/3, 2007Tradução . . Disponível em: https://doi.org/10.1063/1.2736311. Acesso em: 26 jun. 2024.APA
Teixeira, F. de S., Mansano, R. D., Salvadori, M. C. B. da S., Cattani, M. S. D., & Brown, I. G. (2007). Atomic force microscope nanolithography of polymethylmethacrylate polymer. Review of Scientific Instruments, 78( 4), 053702-053702/3. doi:10.1063/1.2736311NLM
Teixeira F de S, Mansano RD, Salvadori MCB da S, Cattani MSD, Brown IG. Atomic force microscope nanolithography of polymethylmethacrylate polymer [Internet]. Review of Scientific Instruments. 2007 ; 78( 4): 053702-053702/3.[citado 2024 jun. 26 ] Available from: https://doi.org/10.1063/1.2736311Vancouver
Teixeira F de S, Mansano RD, Salvadori MCB da S, Cattani MSD, Brown IG. Atomic force microscope nanolithography of polymethylmethacrylate polymer [Internet]. Review of Scientific Instruments. 2007 ; 78( 4): 053702-053702/3.[citado 2024 jun. 26 ] Available from: https://doi.org/10.1063/1.2736311
