Nozaki, Ricardo; Navarro, Hélio Aparecido; Brasil, Reyolando Manoel Lopes Rebello da Fonseca 
; Silva, Marcelo de Assumpção Pereira da ; Tusset, Angelo Marcelo; Bueno, Atila Madureira ; Balthazar, José Manoel
Source: Proceedings of the ASME. Conference titles: International Mechanical Engineering Congress and Exposition - IMECE. Unidades: EESC, EP
Subjects: MODELOS NÃO LINEARES, SENSOR, MICROSCOPIA, SISTEMAS NANOELETROMECÂNICOS
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NOZAKI, Ricardo et al. Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior. 2014, Anais.. New York, NY: ASME, 2014. Disponível em: https://doi.org/10.1115/IMECE2014-38386. Acesso em: 06 nov. 2024.APA
Nozaki, R., Navarro, H. A., Brasil, R. M. L. R. da F., Silva, M. de A. P. da, Tusset, A. M., Bueno, A. M., & Balthazar, J. M. (2014). Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior. In Proceedings of the ASME. New York, NY: ASME. doi:10.1115/IMECE2014-38386NLM
Nozaki R, Navarro HA, Brasil RMLR da F, Silva M de AP da, Tusset AM, Bueno AM, Balthazar JM. Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior [Internet]. Proceedings of the ASME. 2014 ;[citado 2024 nov. 06 ] Available from: https://doi.org/10.1115/IMECE2014-38386Vancouver
Nozaki R, Navarro HA, Brasil RMLR da F, Silva M de AP da, Tusset AM, Bueno AM, Balthazar JM. Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior [Internet]. Proceedings of the ASME. 2014 ;[citado 2024 nov. 06 ] Available from: https://doi.org/10.1115/IMECE2014-38386
