Voßwinkel, Daniel; Benndorf, Christopher; Eckert, Hellmut 
; Matar, Samir F.; Pöttgen, Rainer
Fonte: Zeitschrift für Kristallographie. Unidade: IFSC
Assuntos: CRISTALOGRAFIA, TERRAS RARAS, ESPECTROSCOPIA DE RESSONÂNCIA MAGNÉTICA NUCLEAR
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VOSSWINKEL, Daniel et al. Ternary silicides ScIr4Si2 and RERh4Si2 (RE = Sc, Y, Tb-Lu) and quaternary derivatives RERh4Si2-xSnx (RE = Y, Nd, Sm, Gd-Lu): structure, chemical bonding, and solid state NMR spectroscopy. Zeitschrift für Kristallographie, v. 231, n. 8, p. 475-486, 2016Tradução . . Disponível em: https://doi.org/10.1515/zkri-2016-1957. Acesso em: 02 out. 2024.APA
Voßwinkel, D., Benndorf, C., Eckert, H., Matar, S. F., & Pöttgen, R. (2016). Ternary silicides ScIr4Si2 and RERh4Si2 (RE = Sc, Y, Tb-Lu) and quaternary derivatives RERh4Si2-xSnx (RE = Y, Nd, Sm, Gd-Lu): structure, chemical bonding, and solid state NMR spectroscopy. Zeitschrift für Kristallographie, 231( 8), 475-486. doi:10.1515/zkri-2016-1957NLM
Voßwinkel D, Benndorf C, Eckert H, Matar SF, Pöttgen R. Ternary silicides ScIr4Si2 and RERh4Si2 (RE = Sc, Y, Tb-Lu) and quaternary derivatives RERh4Si2-xSnx (RE = Y, Nd, Sm, Gd-Lu): structure, chemical bonding, and solid state NMR spectroscopy [Internet]. Zeitschrift für Kristallographie. 2016 ; 231( 8): 475-486.[citado 2024 out. 02 ] Available from: https://doi.org/10.1515/zkri-2016-1957Vancouver
Voßwinkel D, Benndorf C, Eckert H, Matar SF, Pöttgen R. Ternary silicides ScIr4Si2 and RERh4Si2 (RE = Sc, Y, Tb-Lu) and quaternary derivatives RERh4Si2-xSnx (RE = Y, Nd, Sm, Gd-Lu): structure, chemical bonding, and solid state NMR spectroscopy [Internet]. Zeitschrift für Kristallographie. 2016 ; 231( 8): 475-486.[citado 2024 out. 02 ] Available from: https://doi.org/10.1515/zkri-2016-1957
