Source: Materials Letters. Unidade: IFSC
Subjects: INFORMAÇÃO QUÂNTICA, CAMPO MAGNÉTICO
ABNT
CAPELI, R. A. et al. Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(100) and Pt/Si(111) using piezoresponse force microscopy. Materials Letters, v. 196, p. 64-68, 2017Tradução . . Disponível em: https://doi.org/10.1016/j.matlet.2017.03.029. Acesso em: 26 ago. 2024.APA
Capeli, R. A., Pontes, F. M., Pontes, D. S. L., Chiquito, A. J., Bastos, W. B., Silva, M. de A. P. da, & Longo, E. (2017). Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(100) and Pt/Si(111) using piezoresponse force microscopy. Materials Letters, 196, 64-68. doi:10.1016/j.matlet.2017.03.029NLM
Capeli RA, Pontes FM, Pontes DSL, Chiquito AJ, Bastos WB, Silva M de AP da, Longo E. Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(100) and Pt/Si(111) using piezoresponse force microscopy [Internet]. Materials Letters. 2017 ; 196 64-68.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/j.matlet.2017.03.029Vancouver
Capeli RA, Pontes FM, Pontes DSL, Chiquito AJ, Bastos WB, Silva M de AP da, Longo E. Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(100) and Pt/Si(111) using piezoresponse force microscopy [Internet]. Materials Letters. 2017 ; 196 64-68.[citado 2024 ago. 26 ] Available from: https://doi.org/10.1016/j.matlet.2017.03.029