Menu

Filtros : "Armas Alvarado, Maria Elisia" "Pelegrini, Marcus Vinícius" Limpar

Filtros

Refine with date range

  • 1

1 - 2 (2 records)

  • Artigo de periodico

    Fabrication and characterization of aluminum nitride pedestal-type optical waveguide (2014)

    Armas Alvarado, Maria Elisia; Pelegrini, Marcus Vinícius ; Pereyra, Inés ; Assumpção, Thiago Alexandre Alves de ; Kassab, Luciana Reyes Pires ; Alayo Chávez, Marco Isaías

    Source: Canadian Journal of Physics. Unidade: EP

    Subjects: RASTREAMENTO, ULTRASSONOGRAFIA

    PrivadoAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      ARMAS ALVARADO, Maria Elisia et al. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, v. 92, p. 952-954, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0587. Acesso em: 30 set. 2024.

    • APA

      Armas Alvarado, M. E., Pelegrini, M. V., Pereyra, I., Assumpção, T. A. A. de, Kassab, L. R. P., & Alayo Chávez, M. I. (2014). Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, 92, 952-954. doi:10.1139/cjp-2013-0587

    • NLM

      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 set. 30 ] Available from: https://doi.org/10.1139/cjp-2013-0587

    • Vancouver

      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 set. 30 ] Available from: https://doi.org/10.1139/cjp-2013-0587

  • Artigo de periodico

    Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering (2014)

    Pelegrini, Marcus Vinícius ; Alayo Chávez, Marco Isaías ; Armas Alvarado, Maria Elisia; Pereyra, Inés

    Source: Canadian Journal of Physics. Unidade: EP

    Assunto: RADIOGRAFIA

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      PELEGRINI, Marcus Vinícius et al. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, v. 92, p. 940-942, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0556. Acesso em: 30 set. 2024.

    • APA

      Pelegrini, M. V., Alayo Chávez, M. I., Armas Alvarado, M. E., & Pereyra, I. (2014). Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, 92, 940-942. doi:10.1139/cjp-2013-0556

    • NLM

      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 set. 30 ] Available from: https://doi.org/10.1139/cjp-2013-0556

    • Vancouver

      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 set. 30 ] Available from: https://doi.org/10.1139/cjp-2013-0556
  • 1

1 - 2 (2 records)

Digital Library of Intellectual Production of Universidade de São Paulo     2012 - 2024