Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111) (2007)
Rodrigues Filho, Ubirajara Pereira 
; Henry-de-Villeneuve, Catherine; Chazalviel, Jean-Nöel; Ozanam, François; Brison, Jéremy; Douhard, Bastien; Pireaux, Jean-Jacques; Houssiau, Laurent; Allongue, Philippe
Fonte: Journal of Electron Spectroscopy and Related Phenomena. Nome do evento: International Conference on Electronic Spectroscopy and Structure. Unidade: IQSC
Assunto: ESPECTROSCOPIA
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RODRIGUES FILHO, Ubirajara Pereira et al. Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. Amsterdam: Elsevier Science. . Acesso em: 02 nov. 2024. , 2007APA
Rodrigues Filho, U. P., Henry-de-Villeneuve, C., Chazalviel, J. -N., Ozanam, F., Brison, J., Douhard, B., et al. (2007). Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. Amsterdam: Elsevier Science.NLM
Rodrigues Filho UP, Henry-de-Villeneuve C, Chazalviel J-N, Ozanam F, Brison J, Douhard B, Pireaux J-J, Houssiau L, Allongue P. Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. 2007 ; 156/158 xx-civ.[citado 2024 nov. 02 ]Vancouver
Rodrigues Filho UP, Henry-de-Villeneuve C, Chazalviel J-N, Ozanam F, Brison J, Douhard B, Pireaux J-J, Houssiau L, Allongue P. Time-of-flight secondary ion mass spectroscopy of organic monolayer on Si(111). Journal of Electron Spectroscopy and Related Phenomena. 2007 ; 156/158 xx-civ.[citado 2024 nov. 02 ]
