Source: Anais eletrônicos. Conference titles: Simpósio em Ciência e Engenharia de Materiais - SICEM. Unidade: EESC
Subjects: VIDROS METÁLICOS, DIFRAÇÃO POR RAIOS X, MATERIAIS
ABNT
ROCHA, Renan Freire de Carvalho Lopes e CAMPOS NETO, Nelson Delfino e OLIVEIRA, Marcelo Falcão de. Comparison between synchrotron and conventional X-ray diffraction to quantification of Y2O3 at Zr52,5Cu17,9Ni14,6Al10Ti5 bulk metallic glass dopped with Y. 2018, Anais.. São Carlos, SP: EESC/USP, 2018. Disponível em: http://soac.eesc.usp.br/index.php/SICEM/sicem2018/paper/view/1231/906. Acesso em: 19 ago. 2024.APA
Rocha, R. F. de C. L., Campos Neto, N. D., & Oliveira, M. F. de. (2018). Comparison between synchrotron and conventional X-ray diffraction to quantification of Y2O3 at Zr52,5Cu17,9Ni14,6Al10Ti5 bulk metallic glass dopped with Y. In Anais eletrônicos. São Carlos, SP: EESC/USP. Recuperado de http://soac.eesc.usp.br/index.php/SICEM/sicem2018/paper/view/1231/906NLM
Rocha RF de CL, Campos Neto ND, Oliveira MF de. Comparison between synchrotron and conventional X-ray diffraction to quantification of Y2O3 at Zr52,5Cu17,9Ni14,6Al10Ti5 bulk metallic glass dopped with Y [Internet]. Anais eletrônicos. 2018 ;[citado 2024 ago. 19 ] Available from: http://soac.eesc.usp.br/index.php/SICEM/sicem2018/paper/view/1231/906Vancouver
Rocha RF de CL, Campos Neto ND, Oliveira MF de. Comparison between synchrotron and conventional X-ray diffraction to quantification of Y2O3 at Zr52,5Cu17,9Ni14,6Al10Ti5 bulk metallic glass dopped with Y [Internet]. Anais eletrônicos. 2018 ;[citado 2024 ago. 19 ] Available from: http://soac.eesc.usp.br/index.php/SICEM/sicem2018/paper/view/1231/906