Si nanocrystal-based systems: photoluminescence and Raman spectroscopy analysis (2008)
Source: Abstracts. Conference titles: International Conference on the Physics of Semiconductors - ICPS. Unidade: IFSC
Subjects: SEMICONDUTORES, NANOTECNOLOGIA, SILÍCIO, SENSOR
ABNT
BORRERO GONZALEZ, Luis José et al. Si nanocrystal-based systems: photoluminescence and Raman spectroscopy analysis. 2008, Anais.. [S.l.]: Instituto de Física de São Carlos, Universidade de São Paulo, 2008. . Acesso em: 05 out. 2024.APA
Borrero Gonzalez, L. J., Guimarães, F. E. G., Pusep, Y. A., Rodrigues, A. D. G., Galzerani, J. C., Wojcik, J., et al. (2008). Si nanocrystal-based systems: photoluminescence and Raman spectroscopy analysis. In Abstracts. [S.l.]: Instituto de Física de São Carlos, Universidade de São Paulo.NLM
Borrero Gonzalez LJ, Guimarães FEG, Pusep YA, Rodrigues ADG, Galzerani JC, Wojcik J, Mascher P, Koropecki RR, Arce RD, Comedi D. Si nanocrystal-based systems: photoluminescence and Raman spectroscopy analysis. Abstracts. 2008 ;[citado 2024 out. 05 ]Vancouver
Borrero Gonzalez LJ, Guimarães FEG, Pusep YA, Rodrigues ADG, Galzerani JC, Wojcik J, Mascher P, Koropecki RR, Arce RD, Comedi D. Si nanocrystal-based systems: photoluminescence and Raman spectroscopy analysis. Abstracts. 2008 ;[citado 2024 out. 05 ]