Scanning electron microscopy examination of 3 different adhesive systems (2005)
Fonte: Quintessence International. Unidades: FO, ICB
Assuntos: ADESIVOS DENTINÁRIOS, MICROSCOPIA ELETRÔNICA DE VARREDURA, RESINAS COMPOSTAS
ABNT
LUZ, Maria Aparecida Alves de Cerqueira e ARANA CHAVEZ, Victor Elias e GARONE NETTO, Narciso. Scanning electron microscopy examination of 3 different adhesive systems. Quintessence International, v. 36, n. 9, p. 687-694, 2005Tradução . . Acesso em: 30 set. 2024.APA
Luz, M. A. A. de C., Arana Chavez, V. E., & Garone Netto, N. (2005). Scanning electron microscopy examination of 3 different adhesive systems. Quintessence International, 36( 9), 687-694.NLM
Luz MAA de C, Arana Chavez VE, Garone Netto N. Scanning electron microscopy examination of 3 different adhesive systems. Quintessence International. 2005 ; 36( 9): 687-694.[citado 2024 set. 30 ]Vancouver
Luz MAA de C, Arana Chavez VE, Garone Netto N. Scanning electron microscopy examination of 3 different adhesive systems. Quintessence International. 2005 ; 36( 9): 687-694.[citado 2024 set. 30 ]