Automated scanning electron microscopy by image analysis system (1998)
Source: Acta Microscopica. Conference titles: Brazilian Conference on Microscopy of Materials. Unidades: EP, IGC
Subjects: MICROSCOPIA ELETRÔNICA, MATÉRIAS PRIMAS MINERAIS
ABNT
KAHN, Henrique et al. Automated scanning electron microscopy by image analysis system. Acta Microscopica. [S.l.]: Escola Politécnica, Universidade de São Paulo. Disponível em: https://repositorio.usp.br/directbitstream/aebb6e4a-580a-45d0-b479-9f2aad7d340a/1022859.pdf. Acesso em: 02 nov. 2024. , 1998APA
Kahn, H., Sant'Agostino, L. M., Mano, E. S., & Tassinari, M. M. M. L. (1998). Automated scanning electron microscopy by image analysis system. Acta Microscopica. Escola Politécnica, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/aebb6e4a-580a-45d0-b479-9f2aad7d340a/1022859.pdfNLM
Kahn H, Sant'Agostino LM, Mano ES, Tassinari MMML. Automated scanning electron microscopy by image analysis system [Internet]. Acta Microscopica. 1998 ;7 241-244.[citado 2024 nov. 02 ] Available from: https://repositorio.usp.br/directbitstream/aebb6e4a-580a-45d0-b479-9f2aad7d340a/1022859.pdfVancouver
Kahn H, Sant'Agostino LM, Mano ES, Tassinari MMML. Automated scanning electron microscopy by image analysis system [Internet]. Acta Microscopica. 1998 ;7 241-244.[citado 2024 nov. 02 ] Available from: https://repositorio.usp.br/directbitstream/aebb6e4a-580a-45d0-b479-9f2aad7d340a/1022859.pdf