Source: Program Book. Conference titles: Brazilian MRS Meeting. Unidade: IFSC
Subjects: TRANSISTORES, DIELÉTRICOS
ABNT
GOMES, Douglas José Correia e MOTTI, Silvia Genaro e MIRANDA, Paulo Barbeitas. Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors. 2017, Anais.. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat, 2017. Disponível em: http://www.eventweb.com.br/xvisbpmat/specific-files/grabFile.php?codigo=BPWV. Acesso em: 04 set. 2024.APA
Gomes, D. J. C., Motti, S. G., & Miranda, P. B. (2017). Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors. In Program Book. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat. Recuperado de http://www.eventweb.com.br/xvisbpmat/specific-files/grabFile.php?codigo=BPWVNLM
Gomes DJC, Motti SG, Miranda PB. Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors [Internet]. Program Book. 2017 ;[citado 2024 set. 04 ] Available from: http://www.eventweb.com.br/xvisbpmat/specific-files/grabFile.php?codigo=BPWVVancouver
Gomes DJC, Motti SG, Miranda PB. Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors [Internet]. Program Book. 2017 ;[citado 2024 set. 04 ] Available from: http://www.eventweb.com.br/xvisbpmat/specific-files/grabFile.php?codigo=BPWV