Filtros : "CRISTALOGRAFIA" "Torriani, I" "Journal of Applied Crystallography" Removido: "USP/Pró-Reitoria de Pesquisa" Limpar


  • Source: Journal of Applied Crystallography. Unidade: IF

    Assunto: CRISTALOGRAFIA

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      KELLERMANN, G et al. Small-angle x-ray scattering beamline of the brazilian synchrotron light laboratory. Journal of Applied Crystallography, v. 30, p. 880-883, 1997Tradução . . Acesso em: 15 nov. 2024.
    • APA

      Kellermann, G., Vicentin, F., Tamura, E., Rocha, M., Tolentino, H., Barbosa, A., et al. (1997). Small-angle x-ray scattering beamline of the brazilian synchrotron light laboratory. Journal of Applied Crystallography, 30, 880-883.
    • NLM

      Kellermann G, Vicentin F, Tamura E, Rocha M, Tolentino H, Barbosa A, Craievich A, Torriani I. Small-angle x-ray scattering beamline of the brazilian synchrotron light laboratory. Journal of Applied Crystallography. 1997 ; 30 880-883.[citado 2024 nov. 15 ]
    • Vancouver

      Kellermann G, Vicentin F, Tamura E, Rocha M, Tolentino H, Barbosa A, Craievich A, Torriani I. Small-angle x-ray scattering beamline of the brazilian synchrotron light laboratory. Journal of Applied Crystallography. 1997 ; 30 880-883.[citado 2024 nov. 15 ]

Digital Library of Intellectual Production of Universidade de São Paulo     2012 - 2024