RBS as a tool for topographic modelling of polycrystalline thin film interactions (1998)
Source: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Conference titles: International Conference on Ion Beam Analysis. Unidade: IF
Subjects: FÍSICA NUCLEAR, ESPECTROSCOPIA ATÔMICA, ESPALHAMENTO, ÍONS, FILMES FINOS
ABNT
BAGLIN, J. E. E. e TABACNIKS, Manfredo e KELLOCK, A. J. RBS as a tool for topographic modelling of polycrystalline thin film interactions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Amsterdam: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.1016/S0168-583X(97)00685-X. Acesso em: 18 nov. 2024. , 1998APA
Baglin, J. E. E., Tabacniks, M., & Kellock, A. J. (1998). RBS as a tool for topographic modelling of polycrystalline thin film interactions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Amsterdam: Instituto de Física, Universidade de São Paulo. doi:10.1016/S0168-583X(97)00685-XNLM
Baglin JEE, Tabacniks M, Kellock AJ. RBS as a tool for topographic modelling of polycrystalline thin film interactions [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 1998 ; 136-138 241-246.[citado 2024 nov. 18 ] Available from: https://doi.org/10.1016/S0168-583X(97)00685-XVancouver
Baglin JEE, Tabacniks M, Kellock AJ. RBS as a tool for topographic modelling of polycrystalline thin film interactions [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 1998 ; 136-138 241-246.[citado 2024 nov. 18 ] Available from: https://doi.org/10.1016/S0168-583X(97)00685-X