Filtros : "ÍONS" "1998" Removidos: "Universidade Federal de São Carlos (UFSCar)" "IGC-GGE" "TEIXEIRA, ANA BEATRIZ VILELA" Limpar

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  • Source: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Conference titles: International Conference on Ion Beam Analysis. Unidade: IF

    Subjects: FÍSICA NUCLEAR, ESPECTROSCOPIA ATÔMICA, ESPALHAMENTO, ÍONS, FILMES FINOS

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    • ABNT

      BAGLIN, J. E. E. e TABACNIKS, Manfredo e KELLOCK, A. J. RBS as a tool for topographic modelling of polycrystalline thin film interactions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Amsterdam: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.1016/S0168-583X(97)00685-X. Acesso em: 18 nov. 2024. , 1998
    • APA

      Baglin, J. E. E., Tabacniks, M., & Kellock, A. J. (1998). RBS as a tool for topographic modelling of polycrystalline thin film interactions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Amsterdam: Instituto de Física, Universidade de São Paulo. doi:10.1016/S0168-583X(97)00685-X
    • NLM

      Baglin JEE, Tabacniks M, Kellock AJ. RBS as a tool for topographic modelling of polycrystalline thin film interactions [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 1998 ; 136-138 241-246.[citado 2024 nov. 18 ] Available from: https://doi.org/10.1016/S0168-583X(97)00685-X
    • Vancouver

      Baglin JEE, Tabacniks M, Kellock AJ. RBS as a tool for topographic modelling of polycrystalline thin film interactions [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 1998 ; 136-138 241-246.[citado 2024 nov. 18 ] Available from: https://doi.org/10.1016/S0168-583X(97)00685-X

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