Spectroscopic investigation of Nd-doped amorphous SiN films (2006)
Source: Journal of Non-Crystalline Solids. Conference titles: International Conference on Amorphous and Nanocrystalline Semicondutors - Science and Technology - ICANS. Unidade: IFSC
Subjects: FILMES FINOS, SEMICONDUTORES, ESPECTROSCOPIA ÓPTICA, SILICONE
ABNT
RIBEIRO, Cristina Tereza Monteiro e ZANATTA, Antonio Ricardo. Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. Amsterdam: Elsevier Science BV. . Acesso em: 01 out. 2024. , 2006APA
Ribeiro, C. T. M., & Zanatta, A. R. (2006). Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. Amsterdam: Elsevier Science BV.NLM
Ribeiro CTM, Zanatta AR. Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. 2006 ; 352( Ju 2006): 1286-1289.[citado 2024 out. 01 ]Vancouver
Ribeiro CTM, Zanatta AR. Spectroscopic investigation of Nd-doped amorphous SiN films. Journal of Non-Crystalline Solids. 2006 ; 352( Ju 2006): 1286-1289.[citado 2024 out. 01 ]