Source: Journal of Applied Crystallography. Unidade: IF
Subjects: CRISTALOGRAFIA, DIFRAÇÃO POR RAIOS X
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CHIAVACCI, L A et al. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites. Journal of Applied Crystallography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803000517. Acesso em: 03 ago. 2024.APA
Chiavacci, L. A., Dahmouche, K., Briois, V., Santilli, C. V., Zea Bermudez, V. de, Carlos, L. D., et al. (2003). Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites. Journal of Applied Crystallography. doi:10.1107/s0021889803000517NLM
Chiavacci LA, Dahmouche K, Briois V, Santilli CV, Zea Bermudez V de, Carlos LD, Jolivet JP, Pulcinelli SH, Craievich AF. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 ago. 03 ] Available from: https://doi.org/10.1107/s0021889803000517Vancouver
Chiavacci LA, Dahmouche K, Briois V, Santilli CV, Zea Bermudez V de, Carlos LD, Jolivet JP, Pulcinelli SH, Craievich AF. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 ago. 03 ] Available from: https://doi.org/10.1107/s0021889803000517
