High-resolution nonlinear ellipse rotation measurements for 3D microscopy (2015)
Source: Technical Summaries. Conference titles: Photonics West. Unidade: IFSC
Subjects: ÓPTICA NÃO LINEAR, FOTÔNICA, POLARIZAÇÃO
ABNT
MISOGUTI, Lino et al. High-resolution nonlinear ellipse rotation measurements for 3D microscopy. 2015, Anais.. Bellingham: International Society for Optical Engineering - SPIE, 2015. Disponível em: http://spie.org/Documents/ConferencesExhibitions/PW15B-Abstracts.pdf. Acesso em: 13 nov. 2024.APA
Misoguti, L., Miguez, M. L., Barbano, E. C., Zílio, S. C., & Coura, J. A. (2015). High-resolution nonlinear ellipse rotation measurements for 3D microscopy. In Technical Summaries. Bellingham: International Society for Optical Engineering - SPIE. Recuperado de http://spie.org/Documents/ConferencesExhibitions/PW15B-Abstracts.pdfNLM
Misoguti L, Miguez ML, Barbano EC, Zílio SC, Coura JA. High-resolution nonlinear ellipse rotation measurements for 3D microscopy [Internet]. Technical Summaries. 2015 ;[citado 2024 nov. 13 ] Available from: http://spie.org/Documents/ConferencesExhibitions/PW15B-Abstracts.pdfVancouver
Misoguti L, Miguez ML, Barbano EC, Zílio SC, Coura JA. High-resolution nonlinear ellipse rotation measurements for 3D microscopy [Internet]. Technical Summaries. 2015 ;[citado 2024 nov. 13 ] Available from: http://spie.org/Documents/ConferencesExhibitions/PW15B-Abstracts.pdf