Pereira, Gustavo Gonçalves Dalkiranis 
; Bocchi, João Henrique Cirilo ; Torres, Bruno Bassi Millan ; Lopeandia-Fernández, Aitor ; Oliveira Junior, Osvaldo Novais de ; Faria, Gregório Couto
Source: IEEE Transactions on Instrumentation and Measurement. Unidade: IFSC
Subjects: TERMOELETRICIDADE, CONDUTIVIDADE ELÉTRICA, FILMES FINOS
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PEREIRA, Gustavo Gonçalves Dalkiranis et al. Measurement system to determine the seebeck coefficient and electrical conductivity of thin films. IEEE Transactions on Instrumentation and Measurement, v. 74, p. 1503706-1-1503706-6, 2025Tradução . . Disponível em: https://doi.org/10.1109/TIM.2025.3553254. Acesso em: 25 fev. 2026.APA
Pereira, G. G. D., Bocchi, J. H. C., Torres, B. B. M., Lopeandia-Fernández, A., Oliveira Junior, O. N. de, & Faria, G. C. (2025). Measurement system to determine the seebeck coefficient and electrical conductivity of thin films. IEEE Transactions on Instrumentation and Measurement, 74, 1503706-1-1503706-6. doi:10.1109/TIM.2025.3553254NLM
Pereira GGD, Bocchi JHC, Torres BBM, Lopeandia-Fernández A, Oliveira Junior ON de, Faria GC. Measurement system to determine the seebeck coefficient and electrical conductivity of thin films [Internet]. IEEE Transactions on Instrumentation and Measurement. 2025 ; 74 1503706-1-1503706-6.[citado 2026 fev. 25 ] Available from: https://doi.org/10.1109/TIM.2025.3553254Vancouver
Pereira GGD, Bocchi JHC, Torres BBM, Lopeandia-Fernández A, Oliveira Junior ON de, Faria GC. Measurement system to determine the seebeck coefficient and electrical conductivity of thin films [Internet]. IEEE Transactions on Instrumentation and Measurement. 2025 ; 74 1503706-1-1503706-6.[citado 2026 fev. 25 ] Available from: https://doi.org/10.1109/TIM.2025.3553254
