Oblitas, Raissa Lima de 
; Teixeira, Fernanda S. ; Salvadori, Maria Cecília Barbosa da Silveira
Source: Microscopy Research and Technique. Unidade: IF
Subjects: FÍSICA NUCLEAR, FILMES FINOS, ESPECTROSCOPIA DE RAIO X, CROMO, ALUMÍNIO, NÍQUEL, SILÍCIO, MICROANÁLISE
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OBLITAS, Raissa Lima de e TEIXEIRA, Fernanda S. e SALVADORI, Maria Cecília Barbosa da Silveira. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis. Microscopy Research and Technique, p. 10 , 2021Tradução . . Disponível em: https://doi.org/10.1002/jemt.23917. Acesso em: 04 jan. 2026.APA
Oblitas, R. L. de, Teixeira, F. S., & Salvadori, M. C. B. da S. (2021). Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis. Microscopy Research and Technique, 10 . doi:10.1002/jemt.23917NLM
Oblitas RL de, Teixeira FS, Salvadori MCB da S. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis [Internet]. Microscopy Research and Technique. 2021 ;10 .[citado 2026 jan. 04 ] Available from: https://doi.org/10.1002/jemt.23917Vancouver
Oblitas RL de, Teixeira FS, Salvadori MCB da S. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis [Internet]. Microscopy Research and Technique. 2021 ;10 .[citado 2026 jan. 04 ] Available from: https://doi.org/10.1002/jemt.23917
