Investigation of porous silicon films structure by optical methods (1992)
Source: Proceedings. Conference titles: Fall Meeting of the Materials Research Society. Unidade: IFQSC
Subjects: MATÉRIA CONDENSADA, CIRCUITOS ELETRÔNICOS, MATÉRIA CONDENSADA (PROPRIEDADES ELÉTRICAS)
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BASMAJI, Pierre et al. Investigation of porous silicon films structure by optical methods. 1992, Anais.. Warrendale: Materials Research Society - MRS, 1992. . Acesso em: 02 jul. 2024.APA
Basmaji, P., Grivickas, V., Surdutovich, G. I., Vitlina, R., & Bagnato, V. S. (1992). Investigation of porous silicon films structure by optical methods. In Proceedings. Warrendale: Materials Research Society - MRS.NLM
Basmaji P, Grivickas V, Surdutovich GI, Vitlina R, Bagnato VS. Investigation of porous silicon films structure by optical methods. Proceedings. 1992 ;[citado 2024 jul. 02 ]Vancouver
Basmaji P, Grivickas V, Surdutovich GI, Vitlina R, Bagnato VS. Investigation of porous silicon films structure by optical methods. Proceedings. 1992 ;[citado 2024 jul. 02 ]
