Maruta, Ricardo Hitoshi; Kim, Hae Yong 
; Huanca, Danilo Roque ; Salcedo, Walter Jaimes
Source: ECS Transactions. Conference titles: Microelectronics Technology and Devices - SBMicro 2010. Unidade: EP
Subjects: GRANULOMETRIA, ALGORITMOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MARUTA, Ricardo Hitoshi et al. A new correlation-based granulometry algorithm with application in characterizing porous silicon nanomaterials. ECS Transactions. Pennington: Escola Politécnica, Universidade de São Paulo. Disponível em: http://ecst.ecsdl.org/content/31/1/273. Acesso em: 11 jul. 2024. , 2010APA
Maruta, R. H., Kim, H. Y., Huanca, D. R., & Salcedo, W. J. (2010). A new correlation-based granulometry algorithm with application in characterizing porous silicon nanomaterials. ECS Transactions. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/1.3474171NLM
Maruta RH, Kim HY, Huanca DR, Salcedo WJ. A new correlation-based granulometry algorithm with application in characterizing porous silicon nanomaterials [Internet]. ECS Transactions. 2010 ; 31( 1): 273-280.[citado 2024 jul. 11 ] Available from: http://ecst.ecsdl.org/content/31/1/273Vancouver
Maruta RH, Kim HY, Huanca DR, Salcedo WJ. A new correlation-based granulometry algorithm with application in characterizing porous silicon nanomaterials [Internet]. ECS Transactions. 2010 ; 31( 1): 273-280.[citado 2024 jul. 11 ] Available from: http://ecst.ecsdl.org/content/31/1/273
