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Filtros : "EESC-SEM" "DUDUCH, JAIME GILBERTO" "Suécia" Removidos: "COMUNICAÇÃO" "EE" Limpar

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  • Trabalho de evento

    Evaluation of eplication performance in the nanometer range by hot molding of Diffractive Optical Elements (2012)

    Granado, R. M.; Cirino, G. A.; Duduch, Jaime Gilberto; Jasinevicius, Renato Goulart

    Source: Proceedings. Conference titles: Euspen International Conference. Unidade: EESC

    Subjects: DISPOSITIVOS ÓPTICOS, ENGENHARIA MECÂNICA

    Versão PublicadaHow to cite
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    • ABNT

      GRANADO, R. M. et al. Evaluation of eplication performance in the nanometer range by hot molding of Diffractive Optical Elements. 2012, Anais.. Stockholm, Sweden: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2012. Disponível em: https://repositorio.usp.br/directbitstream/a5c81581-f980-421c-8851-b9ae89d55d89/OK___trabalho%2014%20-%20Evaluation%20of%20eplication%20performance%20in%20the%20nanometer%20range%20by%20hot%20molding%20of%20Diffractive%20Optical%20Elements.%20%2812th%20euspen%20International%20Con%29%20%281%29.pdf. Acesso em: 12 set. 2024.

    • APA

      Granado, R. M., Cirino, G. A., Duduch, J. G., & Jasinevicius, R. G. (2012). Evaluation of eplication performance in the nanometer range by hot molding of Diffractive Optical Elements. In Proceedings. Stockholm, Sweden: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/a5c81581-f980-421c-8851-b9ae89d55d89/OK___trabalho%2014%20-%20Evaluation%20of%20eplication%20performance%20in%20the%20nanometer%20range%20by%20hot%20molding%20of%20Diffractive%20Optical%20Elements.%20%2812th%20euspen%20International%20Con%29%20%281%29.pdf

    • NLM

      Granado RM, Cirino GA, Duduch JG, Jasinevicius RG. Evaluation of eplication performance in the nanometer range by hot molding of Diffractive Optical Elements [Internet]. Proceedings. 2012 ;[citado 2024 set. 12 ] Available from: https://repositorio.usp.br/directbitstream/a5c81581-f980-421c-8851-b9ae89d55d89/OK___trabalho%2014%20-%20Evaluation%20of%20eplication%20performance%20in%20the%20nanometer%20range%20by%20hot%20molding%20of%20Diffractive%20Optical%20Elements.%20%2812th%20euspen%20International%20Con%29%20%281%29.pdf

    • Vancouver

      Granado RM, Cirino GA, Duduch JG, Jasinevicius RG. Evaluation of eplication performance in the nanometer range by hot molding of Diffractive Optical Elements [Internet]. Proceedings. 2012 ;[citado 2024 set. 12 ] Available from: https://repositorio.usp.br/directbitstream/a5c81581-f980-421c-8851-b9ae89d55d89/OK___trabalho%2014%20-%20Evaluation%20of%20eplication%20performance%20in%20the%20nanometer%20range%20by%20hot%20molding%20of%20Diffractive%20Optical%20Elements.%20%2812th%20euspen%20International%20Con%29%20%281%29.pdf

  • Parte de monografia/livro

    Image recognition and interferometry applied to high performance positioning systems (2012)

    Montanari, Luciana; Porto, Arthur José Vieira; Duduch, Jaime Gilberto

    Source: Proceedings. Conference titles: Euspen International Conference. Unidade: EESC

    Subjects: RECONHECIMENTO DE IMAGEM, REDES NEURAIS, INTERFEROMETRIA

    Versão PublicadaHow to cite
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    • ABNT

      MONTANARI, Luciana e PORTO, Arthur José Vieira e DUDUCH, Jaime Gilberto. Image recognition and interferometry applied to high performance positioning systems. Proceedings. Tradução . Stockholm: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2012. . Disponível em: https://repositorio.usp.br/directbitstream/a451d401-b435-4ccd-8b0b-d9da126152c0/prod_022662_sysno_3002580.pdf. Acesso em: 12 set. 2024.

    • APA

      Montanari, L., Porto, A. J. V., & Duduch, J. G. (2012). Image recognition and interferometry applied to high performance positioning systems. In Proceedings. Stockholm: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/a451d401-b435-4ccd-8b0b-d9da126152c0/prod_022662_sysno_3002580.pdf

    • NLM

      Montanari L, Porto AJV, Duduch JG. Image recognition and interferometry applied to high performance positioning systems [Internet]. In: Proceedings. Stockholm: Escola de Engenharia de São Carlos, Universidade de São Paulo; 2012. [citado 2024 set. 12 ] Available from: https://repositorio.usp.br/directbitstream/a451d401-b435-4ccd-8b0b-d9da126152c0/prod_022662_sysno_3002580.pdf

    • Vancouver

      Montanari L, Porto AJV, Duduch JG. Image recognition and interferometry applied to high performance positioning systems [Internet]. In: Proceedings. Stockholm: Escola de Engenharia de São Carlos, Universidade de São Paulo; 2012. [citado 2024 set. 12 ] Available from: https://repositorio.usp.br/directbitstream/a451d401-b435-4ccd-8b0b-d9da126152c0/prod_022662_sysno_3002580.pdf

  • Trabalho de evento

    Metrology applied to microfabrication (2012)

    Duduch, Jaime Gilberto; Vieira, A. D.; Jasinevicius, Renato Goulart

    Source: Proceedings. Conference titles: Euspen International Conference. Unidade: EESC

    Subjects: METROLOGIA, ENGENHARIA MECÂNICA

    Versão PublicadaHow to cite
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    • ABNT

      DUDUCH, Jaime Gilberto e VIEIRA, A. D. e JASINEVICIUS, Renato Goulart. Metrology applied to microfabrication. 2012, Anais.. Stockholm, Sweden: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2012. Disponível em: https://repositorio.usp.br/directbitstream/4e54d810-c64a-4261-a613-dbfae2768cf3/OK___trabalho%2015%20-%20Metrology%20applied%20to%20microfabrication.%20%2812th%20euspen%20International%20Conference%2C%202012%29.pdf. Acesso em: 12 set. 2024.

    • APA

      Duduch, J. G., Vieira, A. D., & Jasinevicius, R. G. (2012). Metrology applied to microfabrication. In Proceedings. Stockholm, Sweden: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/4e54d810-c64a-4261-a613-dbfae2768cf3/OK___trabalho%2015%20-%20Metrology%20applied%20to%20microfabrication.%20%2812th%20euspen%20International%20Conference%2C%202012%29.pdf

    • NLM

      Duduch JG, Vieira AD, Jasinevicius RG. Metrology applied to microfabrication [Internet]. Proceedings. 2012 ;[citado 2024 set. 12 ] Available from: https://repositorio.usp.br/directbitstream/4e54d810-c64a-4261-a613-dbfae2768cf3/OK___trabalho%2015%20-%20Metrology%20applied%20to%20microfabrication.%20%2812th%20euspen%20International%20Conference%2C%202012%29.pdf

    • Vancouver

      Duduch JG, Vieira AD, Jasinevicius RG. Metrology applied to microfabrication [Internet]. Proceedings. 2012 ;[citado 2024 set. 12 ] Available from: https://repositorio.usp.br/directbitstream/4e54d810-c64a-4261-a613-dbfae2768cf3/OK___trabalho%2015%20-%20Metrology%20applied%20to%20microfabrication.%20%2812th%20euspen%20International%20Conference%2C%202012%29.pdf
  • 1

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