Fonte: Abstracts. Nome do evento: International Biometric Conference. Unidade: ESALQ
Assuntos: MODELOS MATEMÁTICOS, DISTRIBUIÇÃO DE POISSON
ABNT
DEMÉTRIO, Clarice Garcia Borges e VANGENEUGDEN, Tony e MOLENBERGHS, Geert. Marginal correlation from an extended random-effects model for repeated and overdispersed counts. 2008, Anais.. Dublin: Escola Superior de Agricultura Luiz de Queiroz, Universidade de São Paulo, 2008. . Acesso em: 06 set. 2024.APA
Demétrio, C. G. B., Vangeneugden, T., & Molenberghs, G. (2008). Marginal correlation from an extended random-effects model for repeated and overdispersed counts. In Abstracts. Dublin: Escola Superior de Agricultura Luiz de Queiroz, Universidade de São Paulo.NLM
Demétrio CGB, Vangeneugden T, Molenberghs G. Marginal correlation from an extended random-effects model for repeated and overdispersed counts. Abstracts. 2008 ;[citado 2024 set. 06 ]Vancouver
Demétrio CGB, Vangeneugden T, Molenberghs G. Marginal correlation from an extended random-effects model for repeated and overdispersed counts. Abstracts. 2008 ;[citado 2024 set. 06 ]