Source: Journal of Alloys and Compounds. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, FILMES FINOS
ABNT
MORELHÃO, Sérgio Luiz e BRITO, Giancarlo Esposito de Souza e ABRAMOF, Eduardo. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity. Journal of Alloys and Compounds, v. 344, n. 102, p. 207-211, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0925-8388(02)00342-0. Acesso em: 19 nov. 2024.APA
Morelhão, S. L., Brito, G. E. de S., & Abramof, E. (2002). Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity. Journal of Alloys and Compounds, 344( 102), 207-211. doi:10.1016/s0925-8388(02)00342-0NLM
Morelhão SL, Brito GE de S, Abramof E. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity [Internet]. Journal of Alloys and Compounds. 2002 ; 344( 102): 207-211.[citado 2024 nov. 19 ] Available from: https://doi.org/10.1016/s0925-8388(02)00342-0Vancouver
Morelhão SL, Brito GE de S, Abramof E. Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity [Internet]. Journal of Alloys and Compounds. 2002 ; 344( 102): 207-211.[citado 2024 nov. 19 ] Available from: https://doi.org/10.1016/s0925-8388(02)00342-0