Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM (1999)
Source: Proceedings. Conference titles: International Symposium on Electrets. Unidade: IFSC
Assunto: MATÉRIA CONDENSADA
ABNT
RAPOSO, Maria et al. Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. 1999, Anais.. Piscataway: IEEE, 1999. . Acesso em: 18 out. 2024.APA
Raposo, M., Lobo, R. F. M., Silva, M. de A. P. da, Faria, R. M., & Oliveira Junior, O. N. de. (1999). Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. In Proceedings. Piscataway: IEEE.NLM
Raposo M, Lobo RFM, Silva M de AP da, Faria RM, Oliveira Junior ON de. Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. Proceedings. 1999 ;[citado 2024 out. 18 ]Vancouver
Raposo M, Lobo RFM, Silva M de AP da, Faria RM, Oliveira Junior ON de. Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFM. Proceedings. 1999 ;[citado 2024 out. 18 ]