Fonte: Physical Chemistry Chemical Physics. Unidade: IQ
Assuntos: ESPECTROSCOPIA RAMAN, FÍSICO-QUÍMICA
ABNT
RODRIGUES, Daniel C et al. Critical assessment of enhancement factor measurements in surface-enhanced Raman scattering on different substrates. Physical Chemistry Chemical Physics, v. 17, n. 33, p. 21294-21301, 2015Tradução . . Disponível em: https://doi.org/10.1039/c4cp05080k. Acesso em: 15 out. 2024.APA
Rodrigues, D. C., Souza, M. L. de, Souza, K. dos S., Santos, D. P. dos, Andrade, G. F. S., & Temperini, M. L. A. (2015). Critical assessment of enhancement factor measurements in surface-enhanced Raman scattering on different substrates. Physical Chemistry Chemical Physics, 17( 33), 21294-21301. doi:10.1039/c4cp05080kNLM
Rodrigues DC, Souza ML de, Souza K dos S, Santos DP dos, Andrade GFS, Temperini MLA. Critical assessment of enhancement factor measurements in surface-enhanced Raman scattering on different substrates [Internet]. Physical Chemistry Chemical Physics. 2015 ; 17( 33): 21294-21301.[citado 2024 out. 15 ] Available from: https://doi.org/10.1039/c4cp05080kVancouver
Rodrigues DC, Souza ML de, Souza K dos S, Santos DP dos, Andrade GFS, Temperini MLA. Critical assessment of enhancement factor measurements in surface-enhanced Raman scattering on different substrates [Internet]. Physical Chemistry Chemical Physics. 2015 ; 17( 33): 21294-21301.[citado 2024 out. 15 ] Available from: https://doi.org/10.1039/c4cp05080k