Source: Materialia. Unidades: EP, IF
Subjects: DIFRAÇÃO POR RAIOS X, TENSÃO RESIDUAL, ESTANHO
ABNT
COSTA MISCIONE, Juan Manuel et al. Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation. Materialia, v. 28, p. 17 , 2023Tradução . . Disponível em: https://doi.org/10.1016/j.mtla.2023.101715. Acesso em: 15 nov. 2024.APA
Costa Miscione, J. M., Silva, F. C. da, Marcondes, M. L., Petrilli, H. M., & Schön, C. G. (2023). Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation. Materialia, 28, 17 . doi:10.1016/j.mtla.2023.101715NLM
Costa Miscione JM, Silva FC da, Marcondes ML, Petrilli HM, Schön CG. Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation [Internet]. Materialia. 2023 ; 28 17 .[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.mtla.2023.101715Vancouver
Costa Miscione JM, Silva FC da, Marcondes ML, Petrilli HM, Schön CG. Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation [Internet]. Materialia. 2023 ; 28 17 .[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.mtla.2023.101715