Secondary emission impaired by charge accumulation in dielectrics: the dynamical method (2005)
Source: Proceedings. Conference titles: International Symposium on Electrets - ISE. Unidade: IFSC
Subjects: POLÍMEROS (MATERIAIS), DIELÉTRICOS
ABNT
LEAL FERREIRA, Guilherme Fontes e FIGUEIREDO, Mariângela Tassinari de. Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. 2005, Anais.. Piscataway: IEEE Institute of Electrical and Electronics Engineers, 2005. . Acesso em: 01 out. 2024.APA
Leal Ferreira, G. F., & Figueiredo, M. T. de. (2005). Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. In Proceedings. Piscataway: IEEE Institute of Electrical and Electronics Engineers.NLM
Leal Ferreira GF, Figueiredo MT de. Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. Proceedings. 2005 ;[citado 2024 out. 01 ]Vancouver
Leal Ferreira GF, Figueiredo MT de. Secondary emission impaired by charge accumulation in dielectrics: the dynamical method. Proceedings. 2005 ;[citado 2024 out. 01 ]