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  • Artigo de periodico

    Application of multiple regression and neural networks to synthesize a model for peen forming process planning (2010)

    Delijaicov, Sergio ; Fleury, Agenor de Toledo ; Martins, Flavius Portella Ribas

    Source: Journal of Achievements in Materials and Manufacturing Engineering. Unidade: EP

    Assunto: REDES NEURAIS

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    • ABNT

      DELIJAICOV, Sergio e FLEURY, Agenor de Toledo e MARTINS, Flavius Portella Ribas. Application of multiple regression and neural networks to synthesize a model for peen forming process planning. Journal of Achievements in Materials and Manufacturing Engineering, v. 43, n. 2, p. 651-656, 2010Tradução . . Disponível em: https://repositorio.usp.br/directbitstream/e4ccc7b0-9205-452c-83f4-afb440824eef/Fleury-2010-Application%20of%20multiple%20regression%20and%20neural%20ok.pdf. Acesso em: 08 jul. 2024.

    • APA

      Delijaicov, S., Fleury, A. de T., & Martins, F. P. R. (2010). Application of multiple regression and neural networks to synthesize a model for peen forming process planning. Journal of Achievements in Materials and Manufacturing Engineering, 43( 2), 651-656. Recuperado de https://repositorio.usp.br/directbitstream/e4ccc7b0-9205-452c-83f4-afb440824eef/Fleury-2010-Application%20of%20multiple%20regression%20and%20neural%20ok.pdf

    • NLM

      Delijaicov S, Fleury A de T, Martins FPR. Application of multiple regression and neural networks to synthesize a model for peen forming process planning [Internet]. Journal of Achievements in Materials and Manufacturing Engineering. 2010 ; 43( 2): 651-656.[citado 2024 jul. 08 ] Available from: https://repositorio.usp.br/directbitstream/e4ccc7b0-9205-452c-83f4-afb440824eef/Fleury-2010-Application%20of%20multiple%20regression%20and%20neural%20ok.pdf

    • Vancouver

      Delijaicov S, Fleury A de T, Martins FPR. Application of multiple regression and neural networks to synthesize a model for peen forming process planning [Internet]. Journal of Achievements in Materials and Manufacturing Engineering. 2010 ; 43( 2): 651-656.[citado 2024 jul. 08 ] Available from: https://repositorio.usp.br/directbitstream/e4ccc7b0-9205-452c-83f4-afb440824eef/Fleury-2010-Application%20of%20multiple%20regression%20and%20neural%20ok.pdf

  • Artigo de periodico

    Application of computer vision methods to estimate the coverage of peen formed plates (2010)

    Vieira, Luiz Carlos; Almeida, R H Z; Martins, Flavius Portella Ribas ; Fleury, Agenor de Toledo

    Source: Journal of Achievements in Materials and Manufacturing Engineering. Unidade: EP

    Subjects: VISÃO COMPUTACIONAL, PROCESSOS DE FABRICAÇÃO, TRATAMENTO DE SUPERFÍCIES

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    • ABNT

      VIEIRA, Luiz Carlos et al. Application of computer vision methods to estimate the coverage of peen formed plates. Journal of Achievements in Materials and Manufacturing Engineering, v. 43, n. 2, p. 743-749, 2010Tradução . . Disponível em: https://repositorio.usp.br/directbitstream/28acd301-9e92-4d86-8916-96e2c52d3b0b/Fleury-2010-Application%20of%20computer%20vision%20methods%20ok.pdf. Acesso em: 08 jul. 2024.

    • APA

      Vieira, L. C., Almeida, R. H. Z., Martins, F. P. R., & Fleury, A. de T. (2010). Application of computer vision methods to estimate the coverage of peen formed plates. Journal of Achievements in Materials and Manufacturing Engineering, 43( 2), 743-749. Recuperado de https://repositorio.usp.br/directbitstream/28acd301-9e92-4d86-8916-96e2c52d3b0b/Fleury-2010-Application%20of%20computer%20vision%20methods%20ok.pdf

    • NLM

      Vieira LC, Almeida RHZ, Martins FPR, Fleury A de T. Application of computer vision methods to estimate the coverage of peen formed plates [Internet]. Journal of Achievements in Materials and Manufacturing Engineering. 2010 ; 43( 2): 743-749.[citado 2024 jul. 08 ] Available from: https://repositorio.usp.br/directbitstream/28acd301-9e92-4d86-8916-96e2c52d3b0b/Fleury-2010-Application%20of%20computer%20vision%20methods%20ok.pdf

    • Vancouver

      Vieira LC, Almeida RHZ, Martins FPR, Fleury A de T. Application of computer vision methods to estimate the coverage of peen formed plates [Internet]. Journal of Achievements in Materials and Manufacturing Engineering. 2010 ; 43( 2): 743-749.[citado 2024 jul. 08 ] Available from: https://repositorio.usp.br/directbitstream/28acd301-9e92-4d86-8916-96e2c52d3b0b/Fleury-2010-Application%20of%20computer%20vision%20methods%20ok.pdf

  • Trabalho de evento

    Image recostruction base on topology optimization and applied to electrical impedance tomography (2004)

    Lima, Cícero Ribeiro de; González Lima, Raúl ; Silva, Emílio Carlos Nelli

    Source: Proceedings. Conference titles: International Conference on Electrical Bioimpedance. Unidade: EP

    Subjects: TOMOGRAFIA, IMAGEAMENTO (BIOENGENHARIA), PROGRAMAÇÃO NÃO LINEAR, MÉTODO DOS ELEMENTOS FINITOS, BIOENGENHARIA

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    • ABNT

      LIMA, Cícero Ribeiro de e GONZÁLEZ LIMA, Raúl e SILVA, Emílio Carlos Nelli. Image recostruction base on topology optimization and applied to electrical impedance tomography. 2004, Anais.. Gdansk: Escola Politécnica, Universidade de São Paulo, 2004. Disponível em: https://repositorio.usp.br/directbitstream/e0bd5e84-1c75-4dcf-8fbc-ad64aa54a4fd/Lima_R-2004-Image%20reconstruction%20ok.pdf. Acesso em: 08 jul. 2024.

    • APA

      Lima, C. R. de, González Lima, R., & Silva, E. C. N. (2004). Image recostruction base on topology optimization and applied to electrical impedance tomography. In Proceedings. Gdansk: Escola Politécnica, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/e0bd5e84-1c75-4dcf-8fbc-ad64aa54a4fd/Lima_R-2004-Image%20reconstruction%20ok.pdf

    • NLM

      Lima CR de, González Lima R, Silva ECN. Image recostruction base on topology optimization and applied to electrical impedance tomography [Internet]. Proceedings. 2004 ;[citado 2024 jul. 08 ] Available from: https://repositorio.usp.br/directbitstream/e0bd5e84-1c75-4dcf-8fbc-ad64aa54a4fd/Lima_R-2004-Image%20reconstruction%20ok.pdf

    • Vancouver

      Lima CR de, González Lima R, Silva ECN. Image recostruction base on topology optimization and applied to electrical impedance tomography [Internet]. Proceedings. 2004 ;[citado 2024 jul. 08 ] Available from: https://repositorio.usp.br/directbitstream/e0bd5e84-1c75-4dcf-8fbc-ad64aa54a4fd/Lima_R-2004-Image%20reconstruction%20ok.pdf
  • 1

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