Source: Technical Summaries. Conference titles: Photonics West. Unidade: IFSC
Subjects: FILMES FINOS, ESPECTROSCOPIA, TERRAS RARAS
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RIVERA, Victor A. et al. High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. 2013, Anais.. Bellingham: International Society for Optical Engineering - SPIE, 2013. . Acesso em: 25 ago. 2024.APA
Rivera, V. A., Ferri, F. A., Huaman, J. C., Kawamura, M., Silva, M. de A. P. da, Nunes, L. A. de O., et al. (2013). High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. In Technical Summaries. Bellingham: International Society for Optical Engineering - SPIE.NLM
Rivera VA, Ferri FA, Huaman JC, Kawamura M, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. Technical Summaries. 2013 ;[citado 2024 ago. 25 ]Vancouver
Rivera VA, Ferri FA, Huaman JC, Kawamura M, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. Technical Summaries. 2013 ;[citado 2024 ago. 25 ]