Spectroscopic atomic-scale characterization of interfaces in the GaAs/Al FGA As superlattices (1995)
Pusep, Yuri A 
; Silva, S. W.; Galzerani, J. C.; Lubyshev, D. I.; Basmaji, Pierre
Source: Abstracts. Conference titles: International Conference on Solid Surface. Unidade: IFSC
Assunto: POLÍMEROS (MATERIAIS)
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ABNT
PUSEP, Yuri A et al. Spectroscopic atomic-scale characterization of interfaces in the GaAs/Al FGA As superlattices. 1995, Anais.. Birmingham: Institute of Physcis-IOP, 1995. . Acesso em: 13 out. 2024.APA
Pusep, Y. A., Silva, S. W., Galzerani, J. C., Lubyshev, D. I., & Basmaji, P. (1995). Spectroscopic atomic-scale characterization of interfaces in the GaAs/Al FGA As superlattices. In Abstracts. Birmingham: Institute of Physcis-IOP.NLM
Pusep YA, Silva SW, Galzerani JC, Lubyshev DI, Basmaji P. Spectroscopic atomic-scale characterization of interfaces in the GaAs/Al FGA As superlattices. Abstracts. 1995 ;[citado 2024 out. 13 ]Vancouver
Pusep YA, Silva SW, Galzerani JC, Lubyshev DI, Basmaji P. Spectroscopic atomic-scale characterization of interfaces in the GaAs/Al FGA As superlattices. Abstracts. 1995 ;[citado 2024 out. 13 ]
