Ventura, S. D.; Birgin, Ernesto Julian Goldberg 
; Martinez, Jesus Manuel; Chambouleyron, Ivan Emílio
Source: Journal of Applied Physics. Unidade: IME
Assunto: FÍSICA
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ABNT
VENTURA, S. D. et al. Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data. Journal of Applied Physics, v. 97, n. 4, 2005Tradução . . Disponível em: https://doi.org/10.1063/1.1849431. Acesso em: 12 jun. 2024.APA
Ventura, S. D., Birgin, E. J. G., Martinez, J. M., & Chambouleyron, I. E. (2005). Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data. Journal of Applied Physics, 97( 4). doi:10.1063/1.1849431NLM
Ventura SD, Birgin EJG, Martinez JM, Chambouleyron IE. Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data [Internet]. Journal of Applied Physics. 2005 ; 97( 4):[citado 2024 jun. 12 ] Available from: https://doi.org/10.1063/1.1849431Vancouver
Ventura SD, Birgin EJG, Martinez JM, Chambouleyron IE. Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data [Internet]. Journal of Applied Physics. 2005 ; 97( 4):[citado 2024 jun. 12 ] Available from: https://doi.org/10.1063/1.1849431
