Studying organic transistors by charge modulation microscopy (CMM) (2017)
Source: Scientific Program. Conference titles: Encontro Nacional de Física da Matéria Condensada - ENFMC. Unidade: IFSC
Subjects: POLÍMEROS (MATERIAIS), SEMICONDUTORES, FILMES FINOS
ABNT
GOMES, D. J. C. et al. Studying organic transistors by charge modulation microscopy (CMM). 2017, Anais.. São Paulo: Sociedade Brasileira de Física - SBF, 2017. Disponível em: http://www1.sbfisica.org.br/eventos/enfmc/xl/programa/. Acesso em: 17 ago. 2024.APA
Gomes, D. J. C., Miranda, P. B., Pace, G., & Caironi, M. (2017). Studying organic transistors by charge modulation microscopy (CMM). In Scientific Program. São Paulo: Sociedade Brasileira de Física - SBF. Recuperado de http://www1.sbfisica.org.br/eventos/enfmc/xl/programa/NLM
Gomes DJC, Miranda PB, Pace G, Caironi M. Studying organic transistors by charge modulation microscopy (CMM) [Internet]. Scientific Program. 2017 ;[citado 2024 ago. 17 ] Available from: http://www1.sbfisica.org.br/eventos/enfmc/xl/programa/Vancouver
Gomes DJC, Miranda PB, Pace G, Caironi M. Studying organic transistors by charge modulation microscopy (CMM) [Internet]. Scientific Program. 2017 ;[citado 2024 ago. 17 ] Available from: http://www1.sbfisica.org.br/eventos/enfmc/xl/programa/