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Artigo de periodico
X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements (2017)
Morelhao, Sergio Luiz; Remédios, Claudio Marcio Rocha; Calligaris, Guilherme Andrade; Nisbet, Gareth
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, RADIAÇÃO SINCROTRON
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ABNT
MORELHAO, Sergio Luiz et al. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, v. 50, n. 3, p. 689-700, 2017Tradução . . Disponível em: https://doi.org/10.1107/S1600576717004757. Acesso em: 27 set. 2024.
APA
Morelhao, S. L., Remédios, C. M. R., Calligaris, G. A., & Nisbet, G. (2017). X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, 50( 3), 689-700. doi:10.1107/S1600576717004757
NLM
Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/S1600576717004757
Vancouver
Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/S1600576717004757
Artigo de periodico
Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis (2017)
Morelhao, Sergio Luiz; Fornari, Celso I; Rappl, Paulo Henrique de Oliveira; Abramof, Eduardo
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, MATERIAIS NANOESTRUTURADOS
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ABNT
MORELHAO, Sergio Luiz et al. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, v. 50, n. 2, p. 399-410, 2017Tradução . . Disponível em: https://doi.org/10.1107/S1600576717000760. Acesso em: 27 set. 2024.
APA
Morelhao, S. L., Fornari, C. I., Rappl, P. H. de O., & Abramof, E. (2017). Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, 50( 2), 399-410. doi:10.1107/S1600576717000760
NLM
Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/S1600576717000760
Vancouver
Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/S1600576717000760
Artigo de periodico
X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals (2011)
Morelhão, Sergio L ; Remédios, C M R; Freitas, Raul O ; Santos, A O dos
Source: Journal of Applied Crystallography. Unidade: IF
Assunto: RAIOS X
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ABNT
MORELHÃO, Sergio L et al. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, v. fe 2011, n. 1, p. 93-101, 2011Tradução . . Disponível em: https://doi.org/10.1107/S0021889810042391. Acesso em: 27 set. 2024.
APA
Morelhão, S. L., Remédios, C. M. R., Freitas, R. O., & Santos, A. O. dos. (2011). X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, fe 2011( 1), 93-101. doi:10.1107/S0021889810042391
NLM
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/S0021889810042391
Vancouver
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/S0021889810042391
Artigo de periodico
An x-ray diffractometer for accurate structural invariant phase determination (2003)
Morelhão, Sérgio Luiz
Source: Journal of Synchrotron Radiation. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, CRISTALOGRAFIA
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ABNT
MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, v. 10, p. 236-241, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0909049503003789. Acesso em: 27 set. 2024.
APA
Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, 10, 236-241. doi:10.1107/s0909049503003789
NLM
Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0909049503003789
Vancouver
Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0909049503003789
Artigo de periodico
An x-ray diffractometer for accurate structural invariant phase determination (2003)
Morelhao, Sergio Luiz; Morelhão, Sérgio Luiz
Source: Journal of Synchroton Radiation. Unidade: IF
Subjects: CRISTALOGRAFIA FÍSICA, DIFRAÇÃO POR RAIOS X
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ABNT
MORELHAO, Sergio Luiz e MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, v. 10 pt. 3, p. 236-241, 2003Tradução . . Disponível em: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf. Acesso em: 27 set. 2024.
APA
Morelhao, S. L., & Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, 10 pt. 3, 236-241. Recuperado de http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf
NLM
Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2024 set. 27 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf
Vancouver
Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2024 set. 27 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf
Artigo de periodico
Two-dimensional intensity profiles of effective satellites (2002)
Morelhão, Sérgio Luiz; Avanci, L H; Quivy, A. A.; Abramog, E
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, CRISTALOGRAFIA FÍSICA
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ABNT
MORELHÃO, Sérgio Luiz et al. Two-dimensional intensity profiles of effective satellites. Journal of Applied Crystallography, v. 35, p. 69-74, 2002Tradução . . Disponível em: https://doi.org/10.1107/s0021889801018921. Acesso em: 27 set. 2024.
APA
Morelhão, S. L., Avanci, L. H., Quivy, A. A., & Abramog, E. (2002). Two-dimensional intensity profiles of effective satellites. Journal of Applied Crystallography, 35, 69-74. doi:10.1107/s0021889801018921
NLM
Morelhão SL, Avanci LH, Quivy AA, Abramog E. Two-dimensional intensity profiles of effective satellites [Internet]. Journal of Applied Crystallography. 2002 ; 35 69-74.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0021889801018921
Vancouver
Morelhão SL, Avanci LH, Quivy AA, Abramog E. Two-dimensional intensity profiles of effective satellites [Internet]. Journal of Applied Crystallography. 2002 ; 35 69-74.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0021889801018921
Artigo de periodico
Strength tuning of multiple waves in crystals (2001)
Morelhão, Sérgio Luiz; Avanci, L H
Source: Acta Crystallographica Section A. Unidade: IF
Subjects: SEMICONDUTORES, DIFRAÇÃO POR RAIOS X, ÓPTICA ELETRÔNICA
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ABNT
MORELHÃO, Sérgio Luiz e AVANCI, L H. Strength tuning of multiple waves in crystals. Acta Crystallographica Section A, v. 57, p. 192-196, 2001Tradução . . Disponível em: https://doi.org/10.1107/s0108767300015774. Acesso em: 27 set. 2024.
APA
Morelhão, S. L., & Avanci, L. H. (2001). Strength tuning of multiple waves in crystals. Acta Crystallographica Section A, 57, 192-196. doi:10.1107/s0108767300015774
NLM
Morelhão SL, Avanci LH. Strength tuning of multiple waves in crystals [Internet]. Acta Crystallographica Section A. 2001 ; 57 192-196.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0108767300015774
Vancouver
Morelhão SL, Avanci LH. Strength tuning of multiple waves in crystals [Internet]. Acta Crystallographica Section A. 2001 ; 57 192-196.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0108767300015774
Artigo de periodico
Bragg-surface dynamical diffraction (2000)
Avanci, Luis Humberto; Morelhao, Sergio Luiz
Source: Acta crystallographica. Section A. Unidade: IF
Assunto: CRISTALOGRAFIA
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ABNT
AVANCI, Luis Humberto e MORELHAO, Sergio Luiz. Bragg-surface dynamical diffraction. Acta crystallographica. Section A, v. 56, p. 507-508, 2000Tradução . . Disponível em: https://doi.org/10.1107/s0108767300009077. Acesso em: 27 set. 2024.
APA
Avanci, L. H., & Morelhao, S. L. (2000). Bragg-surface dynamical diffraction. Acta crystallographica. Section A, 56, 507-508. doi:10.1107/s0108767300009077
NLM
Avanci LH, Morelhao SL. Bragg-surface dynamical diffraction [Internet]. Acta crystallographica. Section A. 2000 ; 56 507-508.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0108767300009077
Vancouver
Avanci LH, Morelhao SL. Bragg-surface dynamical diffraction [Internet]. Acta crystallographica. Section A. 2000 ; 56 507-508.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0108767300009077
Artigo de periodico
High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) (1999)
Hayashi, M. A.; Avanci, L. H.; Cardoso, L. P.; Carvalho, M. M. G. de; Morelhao, Sergio Luiz; Collins, S. P.
Source: Journal of Synchrotron Radiation. Unidade: IF
Assunto: CRISTALOGRAFIA
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ABNT
HAYASHI, M. A. et al. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001). Journal of Synchrotron Radiation, v. 6, p. 29-33, 1999Tradução . . Disponível em: https://doi.org/10.1107/s0909049598012953. Acesso em: 27 set. 2024.
APA
Hayashi, M. A., Avanci, L. H., Cardoso, L. P., Carvalho, M. M. G. de, Morelhao, S. L., & Collins, S. P. (1999). High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001). Journal of Synchrotron Radiation, 6, 29-33. doi:10.1107/s0909049598012953
NLM
Hayashi MA, Avanci LH, Cardoso LP, Carvalho MMG de, Morelhao SL, Collins SP. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) [Internet]. Journal of Synchrotron Radiation. 1999 ; 6 29-33.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0909049598012953
Vancouver
Hayashi MA, Avanci LH, Cardoso LP, Carvalho MMG de, Morelhao SL, Collins SP. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) [Internet]. Journal of Synchrotron Radiation. 1999 ; 6 29-33.[citado 2024 set. 27 ] Available from: https://doi.org/10.1107/s0909049598012953

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