Structural characterization of polycrystalline Cd-Te-In films (2001)
Source: Journal of Vacuum Science & Tecnology A. Unidade: IFSC
Assunto: FÍSICA DA MATÉRIA CONDENSADA
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ZAPATA-TORRES, M et al. Structural characterization of polycrystalline Cd-Te-In films. Journal of Vacuum Science & Tecnology A, v. 19, n. 1, p. 246-250, 2001Tradução . . Disponível em: https://doi.org/10.1116/1.1322643. Acesso em: 02 jun. 2024.APA
Zapata-Torres, M., Castro-Rodriguez, R., Martel, A., Mascarenhas, Y. P., Guevara, J., Melendez-Lira, M., & Pena, J. L. (2001). Structural characterization of polycrystalline Cd-Te-In films. Journal of Vacuum Science & Tecnology A, 19( 1), 246-250. doi:10.1116/1.1322643NLM
Zapata-Torres M, Castro-Rodriguez R, Martel A, Mascarenhas YP, Guevara J, Melendez-Lira M, Pena JL. Structural characterization of polycrystalline Cd-Te-In films [Internet]. Journal of Vacuum Science & Tecnology A. 2001 ;19( 1): 246-250.[citado 2024 jun. 02 ] Available from: https://doi.org/10.1116/1.1322643Vancouver
Zapata-Torres M, Castro-Rodriguez R, Martel A, Mascarenhas YP, Guevara J, Melendez-Lira M, Pena JL. Structural characterization of polycrystalline Cd-Te-In films [Internet]. Journal of Vacuum Science & Tecnology A. 2001 ;19( 1): 246-250.[citado 2024 jun. 02 ] Available from: https://doi.org/10.1116/1.1322643
