ReP USP - Resultado da busca

Relatorio tecnico
Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer (1999)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier
Unidades: EP, IQ
Assunto: SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier. Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. . São Paulo: EPUSP. . Acesso em: 02 nov. 2024. , 1999
APA
Salcedo, W. J., & Ramírez Fernandez, F. J. (1999). Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. São Paulo: EPUSP.
NLM
Salcedo WJ, Ramírez Fernandez FJ. Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. 1999 ;[citado 2024 nov. 02 ]
Vancouver
Salcedo WJ, Ramírez Fernandez FJ. Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. 1999 ;[citado 2024 nov. 02 ]
Relatorio tecnico
Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies (1999)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier
Unidades: EP, IQ
Assunto: MICROSCOPIA ELETRÔNICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier. Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. . São Paulo: EPUSP. . Acesso em: 02 nov. 2024. , 1999
APA
Salcedo, W. J., & Ramírez Fernandez, F. J. (1999). Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. São Paulo: EPUSP.
NLM
Salcedo WJ, Ramírez Fernandez FJ. Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. 1999 ;[citado 2024 nov. 02 ]
Vancouver
Salcedo WJ, Ramírez Fernandez FJ. Characterization of porous silicon by photoluminescence, ellipsometric and micro-Raman spectroscopies. 1999 ;[citado 2024 nov. 02 ]
Relatorio tecnico
Photonic band structure of periodic-like porous silicon (1999)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier
Unidades: EP, IQ
Assunto: SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier. Photonic band structure of periodic-like porous silicon. . São Paulo: EPUSP. . Acesso em: 02 nov. 2024. , 1999
APA
Salcedo, W. J., & Ramírez Fernandez, F. J. (1999). Photonic band structure of periodic-like porous silicon. São Paulo: EPUSP.
NLM
Salcedo WJ, Ramírez Fernandez FJ. Photonic band structure of periodic-like porous silicon. 1999 ;[citado 2024 nov. 02 ]
Vancouver
Salcedo WJ, Ramírez Fernandez FJ. Photonic band structure of periodic-like porous silicon. 1999 ;[citado 2024 nov. 02 ]
Relatorio tecnico
Polarization effects on the Raman and photoluminescence spectra of porous silicon layers (1999)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier
Unidades: EP, IQ
Assunto: SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. . São Paulo: EPUSP. . Acesso em: 02 nov. 2024. , 1999
APA
Salcedo, W. J., & Ramírez Fernandez, F. J. (1999). Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. São Paulo: EPUSP.
NLM
Salcedo WJ, Ramírez Fernandez FJ. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. 1999 ;[citado 2024 nov. 02 ]
Vancouver
Salcedo WJ, Ramírez Fernandez FJ. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. 1999 ;[citado 2024 nov. 02 ]

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