Tong, C; Lana, Cristiano 
; Marangoni, Yára Regina ; Elis, Vagner Roberto
Source: Eos Transactions AGU, v.91, n.26, Meeting of the Americas Supplement, abstract P43A-07, 2010. Conference titles: 2010 Meeting of the Americas. Unidade: IAG
Subjects: CRATERA DE IMPACTO, PLANETOLOGIA, TECTONOFÍSICA, TOMOGRAFIA
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ABNT
TONG, C et al. Novel use of electrical resistivity tomography in the study of impact craters: a case study of Araguainha impact structure in Brazil. 2010, Anais.. Washington: American Geophysical Union, 2010. . Acesso em: 03 nov. 2024.APA
Tong, C., Lana, C., Marangoni, Y. R., & Elis, V. R. (2010). Novel use of electrical resistivity tomography in the study of impact craters: a case study of Araguainha impact structure in Brazil. In Eos Transactions AGU, v.91, n.26, Meeting of the Americas Supplement, abstract P43A-07, 2010. Washington: American Geophysical Union.NLM
Tong C, Lana C, Marangoni YR, Elis VR. Novel use of electrical resistivity tomography in the study of impact craters: a case study of Araguainha impact structure in Brazil. Eos Transactions AGU, v.91, n.26, Meeting of the Americas Supplement, abstract P43A-07, 2010. 2010 ;[citado 2024 nov. 03 ]Vancouver
Tong C, Lana C, Marangoni YR, Elis VR. Novel use of electrical resistivity tomography in the study of impact craters: a case study of Araguainha impact structure in Brazil. Eos Transactions AGU, v.91, n.26, Meeting of the Americas Supplement, abstract P43A-07, 2010. 2010 ;[citado 2024 nov. 03 ]
