Filtros : "Indexado no Chemical Abstracts" "EP-PSI" Removidos: "PROTEÍNAS" "Livro de Resumos" Limpar

Filtros



Refine with date range


  • Source: International Journal of Food Science and Technology. Unidades: EP, FCF

    Subjects: PLASMA, OXIGÊNIO, MICROBIOLOGIA

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      BOSCARIOL, Michelle Rigamonti et al. Sterilization by pure oxygen plasma and by oxygen-hydrogen peroxide plasma: an efficacy study. International Journal of Food Science and Technology, v. 43, n. 5, p. 170-175, 2008Tradução . . Acesso em: 28 set. 2024.
    • APA

      Boscariol, M. R., Moreira, A. J., Mansano, R. D., Kikuchi, I. S., & Pinto, T. de J. A. (2008). Sterilization by pure oxygen plasma and by oxygen-hydrogen peroxide plasma: an efficacy study. International Journal of Food Science and Technology, 43( 5), 170-175.
    • NLM

      Boscariol MR, Moreira AJ, Mansano RD, Kikuchi IS, Pinto T de JA. Sterilization by pure oxygen plasma and by oxygen-hydrogen peroxide plasma: an efficacy study. International Journal of Food Science and Technology. 2008 ;43( 5): 170-175.[citado 2024 set. 28 ]
    • Vancouver

      Boscariol MR, Moreira AJ, Mansano RD, Kikuchi IS, Pinto T de JA. Sterilization by pure oxygen plasma and by oxygen-hydrogen peroxide plasma: an efficacy study. International Journal of Food Science and Technology. 2008 ;43( 5): 170-175.[citado 2024 set. 28 ]
  • Source: Sensors and Actuators B - Chemical. Unidades: EP, IQ

    Subjects: VOLTAMETRIA, ELETRODEPOSIÇÃO, ELETROQUÍMICA

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      LOWINSOHN, Denise et al. Design and fabrication of a microelectrode array for iodate quantification in small sample volumes. Sensors and Actuators B - Chemical, v. 113, n. 1, p. 80-87, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.snb.2005.02.024. Acesso em: 28 set. 2024.
    • APA

      Lowinsohn, D., Peres, H. E. M., Kosminsky, L., Paixão, T. R. L. C. da, Ferreira, T. L., Ramírez Fernandez, F. J., & Bertotti, M. (2006). Design and fabrication of a microelectrode array for iodate quantification in small sample volumes. Sensors and Actuators B - Chemical, 113( 1), 80-87. doi:10.1016/j.snb.2005.02.024
    • NLM

      Lowinsohn D, Peres HEM, Kosminsky L, Paixão TRLC da, Ferreira TL, Ramírez Fernandez FJ, Bertotti M. Design and fabrication of a microelectrode array for iodate quantification in small sample volumes [Internet]. Sensors and Actuators B - Chemical. 2006 ; 113( 1): 80-87.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/j.snb.2005.02.024
    • Vancouver

      Lowinsohn D, Peres HEM, Kosminsky L, Paixão TRLC da, Ferreira TL, Ramírez Fernandez FJ, Bertotti M. Design and fabrication of a microelectrode array for iodate quantification in small sample volumes [Internet]. Sensors and Actuators B - Chemical. 2006 ; 113( 1): 80-87.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/j.snb.2005.02.024
  • Source: Brazilian Journal of Physics. Unidades: FFCLRP, EP

    Subjects: TRANSISTORES, SENSORES BIOMÉDICOS

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      BATISTA, P. D. et al. Sn 'O IND.2' extended gate field-effect transistor as pH sensor. Brazilian Journal of Physics, v. 36, n. 2A, p. 478-481, 2006Tradução . . Acesso em: 28 set. 2024.
    • APA

      Batista, P. D., Graeff, C. F. de O., Ramírez Fernandez, F. J., & Marques, F. das C. (2006). Sn 'O IND.2' extended gate field-effect transistor as pH sensor. Brazilian Journal of Physics, 36( 2A), 478-481.
    • NLM

      Batista PD, Graeff CF de O, Ramírez Fernandez FJ, Marques F das C. Sn 'O IND.2' extended gate field-effect transistor as pH sensor. Brazilian Journal of Physics. 2006 ; 36( 2A): 478-481.[citado 2024 set. 28 ]
    • Vancouver

      Batista PD, Graeff CF de O, Ramírez Fernandez FJ, Marques F das C. Sn 'O IND.2' extended gate field-effect transistor as pH sensor. Brazilian Journal of Physics. 2006 ; 36( 2A): 478-481.[citado 2024 set. 28 ]
  • Source: Sensors and Actuators B - Chemical. Unidades: IQ, EP

    Subjects: FILMES FINOS, COMPOSTOS ORGÂNICOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      CARVALHO, Alexsander Tressino de et al. Improvement on organic compound adsorption and/or detection by using metallic thin films deposited onto highly rough silicon substrates. Sensors and Actuators B - Chemical, v. 108, n. 1-2, p. 947-954, 2005Tradução . . Disponível em: https://doi.org/10.1016/j.snb.2004.11.065. Acesso em: 28 set. 2024.
    • APA

      Carvalho, A. T. de, Silva, M. L. P. da, Nascimento Filho, A. P. do, Jesus, D. P. de, & Santos Filho, S. G. dos. (2005). Improvement on organic compound adsorption and/or detection by using metallic thin films deposited onto highly rough silicon substrates. Sensors and Actuators B - Chemical, 108( 1-2), 947-954. doi:10.1016/j.snb.2004.11.065
    • NLM

      Carvalho AT de, Silva MLP da, Nascimento Filho AP do, Jesus DP de, Santos Filho SG dos. Improvement on organic compound adsorption and/or detection by using metallic thin films deposited onto highly rough silicon substrates [Internet]. Sensors and Actuators B - Chemical. 2005 ; 108( 1-2): 947-954.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/j.snb.2004.11.065
    • Vancouver

      Carvalho AT de, Silva MLP da, Nascimento Filho AP do, Jesus DP de, Santos Filho SG dos. Improvement on organic compound adsorption and/or detection by using metallic thin films deposited onto highly rough silicon substrates [Internet]. Sensors and Actuators B - Chemical. 2005 ; 108( 1-2): 947-954.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/j.snb.2004.11.065
  • Source: Sensor Letters. Unidades: EP, IFSC

    Assunto: FILMES FINOS

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      CONSTANTINO, Carlos José Leopoldo et al. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters, v. 2, n. 2, p. 95-101, 2004Tradução . . Acesso em: 28 set. 2024.
    • APA

      Constantino, C. J. L., Antunes, P. A., Venâncio, E. C., Consolin, N., Fonseca, F. J., Mattoso, L. H. C., et al. (2004). Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters, 2( 2), 95-101.
    • NLM

      Constantino CJL, Antunes PA, Venâncio EC, Consolin N, Fonseca FJ, Mattoso LHC, Aroca RF, Oliveira Junior ON de, Riul Junior A. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters. 2004 ; 2( 2): 95-101.[citado 2024 set. 28 ]
    • Vancouver

      Constantino CJL, Antunes PA, Venâncio EC, Consolin N, Fonseca FJ, Mattoso LHC, Aroca RF, Oliveira Junior ON de, Riul Junior A. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters. 2004 ; 2( 2): 95-101.[citado 2024 set. 28 ]
  • Source: Applied Surface Science. Unidades: FCF, EP

    Subjects: PLASMA, OXIGÊNIO, MICROBIOLOGIA

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      MOREIRA, Adir José et al. Sterilization by oxygen plasma. Applied Surface Science, v. 235, n. 1-2, p. 151-155, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2004.05.128. Acesso em: 28 set. 2024.
    • APA

      Moreira, A. J., Mansano, R. D., Pinto, T. de J. A., Ruas, R., Zambon, L. da S., Silva, M. V. da, & Verdonck, P. B. (2004). Sterilization by oxygen plasma. Applied Surface Science, 235( 1-2), 151-155. doi:10.1016/j.apsusc.2004.05.128
    • NLM

      Moreira AJ, Mansano RD, Pinto T de JA, Ruas R, Zambon L da S, Silva MV da, Verdonck PB. Sterilization by oxygen plasma [Internet]. Applied Surface Science. 2004 ; 235( 1-2): 151-155.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/j.apsusc.2004.05.128
    • Vancouver

      Moreira AJ, Mansano RD, Pinto T de JA, Ruas R, Zambon L da S, Silva MV da, Verdonck PB. Sterilization by oxygen plasma [Internet]. Applied Surface Science. 2004 ; 235( 1-2): 151-155.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/j.apsusc.2004.05.128
  • Source: Diamond and Related Materials. Unidades: EESC, EP

    Subjects: FILMES FINOS, CORROSÃO DOS MATERIAIS, AÇO INOXIDÁVEL

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      MANSANO, Ronaldo Domingues et al. Protective carbon layer for chemical corrosion of stainless steel. Diamond and Related Materials, v. 12, n. 3-7, p. 749-752, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0925-9635(02)00270-4. Acesso em: 28 set. 2024.
    • APA

      Mansano, R. D., Massi, M., Santos, A. P. M. dos, Zambom, L. da S., & Gonçalves Neto, L. (2003). Protective carbon layer for chemical corrosion of stainless steel. Diamond and Related Materials, 12( 3-7), 749-752. doi:10.1016/s0925-9635(02)00270-4
    • NLM

      Mansano RD, Massi M, Santos APM dos, Zambom L da S, Gonçalves Neto L. Protective carbon layer for chemical corrosion of stainless steel [Internet]. Diamond and Related Materials. 2003 ; 12( 3-7): 749-752.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0925-9635(02)00270-4
    • Vancouver

      Mansano RD, Massi M, Santos APM dos, Zambom L da S, Gonçalves Neto L. Protective carbon layer for chemical corrosion of stainless steel [Internet]. Diamond and Related Materials. 2003 ; 12( 3-7): 749-752.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0925-9635(02)00270-4
  • Source: Sensors and Actuators B : Chemical. Unidade: EP

    Subjects: POLIMERIZAÇÃO, PLASMA

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      NASCIMENTO FILHO, Antonio Pereira do et al. Use of plasma polymerized highly polar organic compound films for sensor development. Sensors and Actuators B : Chemical, v. 91, n. 1-3, p. 370-377, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0925-4005(03)00111-4. Acesso em: 28 set. 2024.
    • APA

      Nascimento Filho, A. P. do, Silva, M. L. P. da, Galeazzo, E., & Demarquette, N. R. (2003). Use of plasma polymerized highly polar organic compound films for sensor development. Sensors and Actuators B : Chemical, 91( 1-3), 370-377. doi:10.1016/s0925-4005(03)00111-4
    • NLM

      Nascimento Filho AP do, Silva MLP da, Galeazzo E, Demarquette NR. Use of plasma polymerized highly polar organic compound films for sensor development [Internet]. Sensors and Actuators B : Chemical. 2003 ; 91( 1-3): 370-377.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0925-4005(03)00111-4
    • Vancouver

      Nascimento Filho AP do, Silva MLP da, Galeazzo E, Demarquette NR. Use of plasma polymerized highly polar organic compound films for sensor development [Internet]. Sensors and Actuators B : Chemical. 2003 ; 91( 1-3): 370-377.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0925-4005(03)00111-4
  • Source: Thin Solid Films. Unidade: EP

    Subjects: MATERIAIS (PROPRIEDADES MECÂNICAS), MATERIAIS (PROPRIEDADES PLÁSTICAS), ÓXIDO NÍTRICO

    PrivadoAcesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      GUIMARÃES, Marcelo Silva et al. Mechanical and thermophysical properties of PECVD oxynitride films measured by mems. Thin Solid Films, v. no 2001, p. 626-631, 2001Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(01)01329-3. Acesso em: 28 set. 2024.
    • APA

      Guimarães, M. S., Sinatora, A., Aloyo, M. I., Pereyra, I., & Páez Carreño, M. N. (2001). Mechanical and thermophysical properties of PECVD oxynitride films measured by mems. Thin Solid Films, no 2001, 626-631. doi:10.1016/s0040-6090(01)01329-3
    • NLM

      Guimarães MS, Sinatora A, Aloyo MI, Pereyra I, Páez Carreño MN. Mechanical and thermophysical properties of PECVD oxynitride films measured by mems [Internet]. Thin Solid Films. 2001 ; no 2001 626-631.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0040-6090(01)01329-3
    • Vancouver

      Guimarães MS, Sinatora A, Aloyo MI, Pereyra I, Páez Carreño MN. Mechanical and thermophysical properties of PECVD oxynitride films measured by mems [Internet]. Thin Solid Films. 2001 ; no 2001 626-631.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0040-6090(01)01329-3
  • Source: IEEE Transactions on Education. Unidade: EP

    Assunto: ENGENHARIA ELÉTRICA (EDUCAÇÃO)

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      CONSONNI, Denise e SEABRA, Antonio Carlos. A modern approach to teaching basic experimental Electricity and Electronics. IEEE Transactions on Education, v. 44, n. 1, p. 5-15, 2001Tradução . . Disponível em: https://doi.org/10.1109/13.912704. Acesso em: 28 set. 2024.
    • APA

      Consonni, D., & Seabra, A. C. (2001). A modern approach to teaching basic experimental Electricity and Electronics. IEEE Transactions on Education, 44( 1), 5-15. doi:10.1109/13.912704
    • NLM

      Consonni D, Seabra AC. A modern approach to teaching basic experimental Electricity and Electronics [Internet]. IEEE Transactions on Education. 2001 ; 44( 1): 5-15.[citado 2024 set. 28 ] Available from: https://doi.org/10.1109/13.912704
    • Vancouver

      Consonni D, Seabra AC. A modern approach to teaching basic experimental Electricity and Electronics [Internet]. IEEE Transactions on Education. 2001 ; 44( 1): 5-15.[citado 2024 set. 28 ] Available from: https://doi.org/10.1109/13.912704
  • Source: Applied Optics. Unidades: EESC, EP

    Assunto: ÓPTICA

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      GONÇALVES NETO, Luiz et al. Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle. Applied Optics, v. 40, n. Ja 2001, p. 211-218, 2001Tradução . . Disponível em: https://doi.org/10.1364/ao.40.000211. Acesso em: 28 set. 2024.
    • APA

      Gonçalves Neto, L., Roberto, L. B., Verdonck, P. B., Mansano, R. D., Cirino, G. A., & Stefani, M. A. (2001). Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle. Applied Optics, 40( Ja 2001), 211-218. doi:10.1364/ao.40.000211
    • NLM

      Gonçalves Neto L, Roberto LB, Verdonck PB, Mansano RD, Cirino GA, Stefani MA. Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle [Internet]. Applied Optics. 2001 ; 40( Ja 2001): 211-218.[citado 2024 set. 28 ] Available from: https://doi.org/10.1364/ao.40.000211
    • Vancouver

      Gonçalves Neto L, Roberto LB, Verdonck PB, Mansano RD, Cirino GA, Stefani MA. Design and fabrication of a hybrid diffractive optical device for multiple-line generation over a wide angle [Internet]. Applied Optics. 2001 ; 40( Ja 2001): 211-218.[citado 2024 set. 28 ] Available from: https://doi.org/10.1364/ao.40.000211
  • Source: Solid-State Electronics. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      NICOLETT, Aparecido Sirley et al. Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs. Solid-State Electronics, v. No 2000, n. 11, p. 1961-1969, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(00)00166-0. Acesso em: 28 set. 2024.
    • APA

      Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (2000). Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs. Solid-State Electronics, No 2000( 11), 1961-1969. doi:10.1016/s0038-1101(00)00166-0
    • NLM

      Nicolett AS, Martino JA, Simoen E, Claeys C. Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs [Internet]. Solid-State Electronics. 2000 ; No 2000( 11): 1961-1969.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(00)00166-0
    • Vancouver

      Nicolett AS, Martino JA, Simoen E, Claeys C. Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs [Internet]. Solid-State Electronics. 2000 ; No 2000( 11): 1961-1969.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(00)00166-0
  • Source: Solid-State Electronics. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      PAVANELLO, Marcelo Antonio et al. Analog performance and application of graded-channel fully depleted SOI MOSFETs. Solid-State Electronics, v. 44, n. 7, p. 1219-1222, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(00)00034-4. Acesso em: 28 set. 2024.
    • APA

      Pavanello, M. A., Martino, J. A., Dessard, V., & Flandre, D. (2000). Analog performance and application of graded-channel fully depleted SOI MOSFETs. Solid-State Electronics, 44( 7), 1219-1222. doi:10.1016/s0038-1101(00)00034-4
    • NLM

      Pavanello MA, Martino JA, Dessard V, Flandre D. Analog performance and application of graded-channel fully depleted SOI MOSFETs [Internet]. Solid-State Electronics. 2000 ; 44( 7): 1219-1222.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(00)00034-4
    • Vancouver

      Pavanello MA, Martino JA, Dessard V, Flandre D. Analog performance and application of graded-channel fully depleted SOI MOSFETs [Internet]. Solid-State Electronics. 2000 ; 44( 7): 1219-1222.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(00)00034-4
  • Source: Solid-State Electronics. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      PAVANELLO, Marcelo Antonio e MARTINO, João Antonio e FLANDRE, Denis. Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects. Solid-State Electronics, v. 44, n. 6, p. 917-922, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(00)00032-0. Acesso em: 28 set. 2024.
    • APA

      Pavanello, M. A., Martino, J. A., & Flandre, D. (2000). Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects. Solid-State Electronics, 44( 6), 917-922. doi:10.1016/s0038-1101(00)00032-0
    • NLM

      Pavanello MA, Martino JA, Flandre D. Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects [Internet]. Solid-State Electronics. 2000 ; 44( 6): 917-922.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(00)00032-0
    • Vancouver

      Pavanello MA, Martino JA, Flandre D. Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects [Internet]. Solid-State Electronics. 2000 ; 44( 6): 917-922.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(00)00032-0
  • Source: Solid-State Electronics. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      NICOLETT, Aparecido Sirley et al. Extraction of the lightly doped drain concentration of fully depleted SOI nMOSFETs using the back gate bias effect. Solid-State Electronics, v. 44, n. 4, p. 677-684, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(99)00293-2. Acesso em: 28 set. 2024.
    • APA

      Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (2000). Extraction of the lightly doped drain concentration of fully depleted SOI nMOSFETs using the back gate bias effect. Solid-State Electronics, 44( 4), 677-684. doi:10.1016/s0038-1101(99)00293-2
    • NLM

      Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the lightly doped drain concentration of fully depleted SOI nMOSFETs using the back gate bias effect [Internet]. Solid-State Electronics. 2000 ; 44( 4): 677-684.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(99)00293-2
    • Vancouver

      Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the lightly doped drain concentration of fully depleted SOI nMOSFETs using the back gate bias effect [Internet]. Solid-State Electronics. 2000 ; 44( 4): 677-684.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0038-1101(99)00293-2
  • Source: Thin Solid Films. Unidade: EP

    Assunto: FILMES

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      MANSANO, Ronaldo Domingues et al. Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering. Thin Solid Films, n. 373, p. 243-246, 2000Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(00)01088-9. Acesso em: 28 set. 2024.
    • APA

      Mansano, R. D., Massi, M., Zambom, L. da S., Verdonck, P. B., Nogueira, P. M., Maciel, H. S., & Otani, C. (2000). Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering. Thin Solid Films, ( 373), 243-246. doi:10.1016/s0040-6090(00)01088-9
    • NLM

      Mansano RD, Massi M, Zambom L da S, Verdonck PB, Nogueira PM, Maciel HS, Otani C. Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering [Internet]. Thin Solid Films. 2000 ;( 373): 243-246.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0040-6090(00)01088-9
    • Vancouver

      Mansano RD, Massi M, Zambom L da S, Verdonck PB, Nogueira PM, Maciel HS, Otani C. Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering [Internet]. Thin Solid Films. 2000 ;( 373): 243-246.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0040-6090(00)01088-9
  • Source: IEEE Transactions on Signal Processing. Unidade: EP

    Assunto: FILTROS ELÉTRICOS DIGITAIS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      NASCIMENTO, Vítor Heloiz e SAYED, Ali Hussein. Unbiased and stable leakage-based adaptive filters. IEEE Transactions on Signal Processing, v. 47, n. 12, p. 3261-3276, 1999Tradução . . Disponível em: https://doi.org/10.1109/78.806071. Acesso em: 28 set. 2024.
    • APA

      Nascimento, V. H., & Sayed, A. H. (1999). Unbiased and stable leakage-based adaptive filters. IEEE Transactions on Signal Processing, 47( 12), 3261-3276. doi:10.1109/78.806071
    • NLM

      Nascimento VH, Sayed AH. Unbiased and stable leakage-based adaptive filters [Internet]. IEEE Transactions on Signal Processing. 1999 ; 47( 12): 3261-3276.[citado 2024 set. 28 ] Available from: https://doi.org/10.1109/78.806071
    • Vancouver

      Nascimento VH, Sayed AH. Unbiased and stable leakage-based adaptive filters [Internet]. IEEE Transactions on Signal Processing. 1999 ; 47( 12): 3261-3276.[citado 2024 set. 28 ] Available from: https://doi.org/10.1109/78.806071
  • Source: Thin Solid Films. Unidade: EP

    Assunto: FILMES FINOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      ZAMBOM, Luís da Silva et al. LPCVD deposition of silicon nitride assisted by high density plasmas. Thin Solid Films, v. 343-344, p. 299-301, 1999Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(98)01587-9. Acesso em: 28 set. 2024.
    • APA

      Zambom, L. da S., Mansano, R. D., Furlan, R., & Verdonck, P. B. (1999). LPCVD deposition of silicon nitride assisted by high density plasmas. Thin Solid Films, 343-344, 299-301. doi:10.1016/s0040-6090(98)01587-9
    • NLM

      Zambom L da S, Mansano RD, Furlan R, Verdonck PB. LPCVD deposition of silicon nitride assisted by high density plasmas [Internet]. Thin Solid Films. 1999 ; 343-344 299-301.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0040-6090(98)01587-9
    • Vancouver

      Zambom L da S, Mansano RD, Furlan R, Verdonck PB. LPCVD deposition of silicon nitride assisted by high density plasmas [Internet]. Thin Solid Films. 1999 ; 343-344 299-301.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0040-6090(98)01587-9
  • Source: Vaccum. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      MANSANO, Ronaldo Domingues e VERDONCK, Patrick Bernard e MACIEL, Homero Santiago. Mechanisms of surface roughness induced in silicon by fluorine containing plasmas. Vaccum, v. 48, n. 7-9, p. 677-679, 1997Tradução . . Disponível em: https://doi.org/10.1016/s0042-207x(97)00067-5. Acesso em: 28 set. 2024.
    • APA

      Mansano, R. D., Verdonck, P. B., & Maciel, H. S. (1997). Mechanisms of surface roughness induced in silicon by fluorine containing plasmas. Vaccum, 48( 7-9), 677-679. doi:10.1016/s0042-207x(97)00067-5
    • NLM

      Mansano RD, Verdonck PB, Maciel HS. Mechanisms of surface roughness induced in silicon by fluorine containing plasmas [Internet]. Vaccum. 1997 ; 48( 7-9): 677-679.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0042-207x(97)00067-5
    • Vancouver

      Mansano RD, Verdonck PB, Maciel HS. Mechanisms of surface roughness induced in silicon by fluorine containing plasmas [Internet]. Vaccum. 1997 ; 48( 7-9): 677-679.[citado 2024 set. 28 ] Available from: https://doi.org/10.1016/s0042-207x(97)00067-5
  • Source: Materials Research Society Symposium Proceedings. Unidade: EP

    Assunto: DISPOSITIVOS ELETRÔNICOS

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      MARTINS, R. et al. The role of the species formed in PECVD systems on the density of state of a Si:H films. Materials Research Society Symposium Proceedings, v. 192, p. 175-180, 1990Tradução . . Acesso em: 28 set. 2024.
    • APA

      Martins, R., Vieira, M., Fortunato, E., Santos, M., Dirani, E. A. T., Carvalho, N., et al. (1990). The role of the species formed in PECVD systems on the density of state of a Si:H films. Materials Research Society Symposium Proceedings, 192, 175-180.
    • NLM

      Martins R, Vieira M, Fortunato E, Santos M, Dirani EAT, Carvalho N, Baia I, Guimarães I. The role of the species formed in PECVD systems on the density of state of a Si:H films. Materials Research Society Symposium Proceedings. 1990 ; 192 175-180.[citado 2024 set. 28 ]
    • Vancouver

      Martins R, Vieira M, Fortunato E, Santos M, Dirani EAT, Carvalho N, Baia I, Guimarães I. The role of the species formed in PECVD systems on the density of state of a Si:H films. Materials Research Society Symposium Proceedings. 1990 ; 192 175-180.[citado 2024 set. 28 ]

Digital Library of Intellectual Production of Universidade de São Paulo     2012 - 2024