Source: International Journal of Molecular Sciences. Unidade: IFSC
Subjects: MICROSCOPIA, NANOTECNOLOGIA, ESPECTROSCOPIA ATÔMICA
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LEITE, Fabio L. et al. Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy. International Journal of Molecular Sciences, v. 13, n. 10, p. 12773-12856, 2012Tradução . . Disponível em: https://doi.org/10.3390/ijms131012773. Acesso em: 26 jun. 2024.APA
Leite, F. L., Bueno, C. C., Da Róz, A. L., Ziemath, E. C., & Oliveira Junior, O. N. de. (2012). Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy. International Journal of Molecular Sciences, 13( 10), 12773-12856. doi:10.3390/ijms131012773NLM
Leite FL, Bueno CC, Da Róz AL, Ziemath EC, Oliveira Junior ON de. Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy [Internet]. International Journal of Molecular Sciences. 2012 ; 13( 10): 12773-12856.[citado 2024 jun. 26 ] Available from: https://doi.org/10.3390/ijms131012773Vancouver
Leite FL, Bueno CC, Da Róz AL, Ziemath EC, Oliveira Junior ON de. Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy [Internet]. International Journal of Molecular Sciences. 2012 ; 13( 10): 12773-12856.[citado 2024 jun. 26 ] Available from: https://doi.org/10.3390/ijms131012773
