Filtros : "IFSC033" "Oliveira Junior, Osvaldo Novais de" "OLIVEIRA JUNIOR, OSVALDO NOVAIS DE" Removidos: "IQ-QFL" "Japão" "1913" Limpar

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  • Source: International Journal of Molecular Sciences. Unidade: IFSC

    Subjects: MICROSCOPIA, NANOTECNOLOGIA, ESPECTROSCOPIA ATÔMICA

    Acesso à fonteDOIHow to cite
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    • ABNT

      LEITE, Fabio L. et al. Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy. International Journal of Molecular Sciences, v. 13, n. 10, p. 12773-12856, 2012Tradução . . Disponível em: https://doi.org/10.3390/ijms131012773. Acesso em: 18 nov. 2024.
    • APA

      Leite, F. L., Bueno, C. C., Da Róz, A. L., Ziemath, E. C., & Oliveira Junior, O. N. de. (2012). Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy. International Journal of Molecular Sciences, 13( 10), 12773-12856. doi:10.3390/ijms131012773
    • NLM

      Leite FL, Bueno CC, Da Róz AL, Ziemath EC, Oliveira Junior ON de. Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy [Internet]. International Journal of Molecular Sciences. 2012 ; 13( 10): 12773-12856.[citado 2024 nov. 18 ] Available from: https://doi.org/10.3390/ijms131012773
    • Vancouver

      Leite FL, Bueno CC, Da Róz AL, Ziemath EC, Oliveira Junior ON de. Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy [Internet]. International Journal of Molecular Sciences. 2012 ; 13( 10): 12773-12856.[citado 2024 nov. 18 ] Available from: https://doi.org/10.3390/ijms131012773

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