Source: Journal of Applied Crystallography. Unidade: IFSC
Subjects: CRISTALOGRAFIA, RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
AMIRKHANYAN, Zohrab G. et al. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, v. 47, p. 160-165, 2014Tradução . . Disponível em: https://doi.org/10.1107/S1600576713028677. Acesso em: 28 maio 2024.APA
Amirkhanyan, Z. G., Remédios, C. M. R., Mascarenhas, Y. P., & Morelhão, S. L. (2014). Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, 47, 160-165. doi:10.1107/S1600576713028677NLM
Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.[citado 2024 maio 28 ] Available from: https://doi.org/10.1107/S1600576713028677Vancouver
Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.[citado 2024 maio 28 ] Available from: https://doi.org/10.1107/S1600576713028677
