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Trabalho de evento
On a new type of micrometer-structured non-diffracting wave field: surface beams based on continuous superpositions of zeroth-order bessel beams (2019)
Ambrosio, Leonardo André
Source: Proceedings. Conference titles: International Microwave and Optoelectronics Conference - IMOC. Unidade: EESC
Subjects: FEIXES ÓPTICOS, ELETROMAGNETISMO, ENGENHARIA ELÉTRICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
AMBROSIO, Leonardo André. On a new type of micrometer-structured non-diffracting wave field: surface beams based on continuous superpositions of zeroth-order bessel beams. 2019, Anais.. São Caetano do Sul, SP: SBMO, 2019. . Acesso em: 21 jun. 2024.
APA
Ambrosio, L. A. (2019). On a new type of micrometer-structured non-diffracting wave field: surface beams based on continuous superpositions of zeroth-order bessel beams. In Proceedings. São Caetano do Sul, SP: SBMO.
NLM
Ambrosio LA. On a new type of micrometer-structured non-diffracting wave field: surface beams based on continuous superpositions of zeroth-order bessel beams. Proceedings. 2019 ;[citado 2024 jun. 21 ]
Vancouver
Ambrosio LA. On a new type of micrometer-structured non-diffracting wave field: surface beams based on continuous superpositions of zeroth-order bessel beams. Proceedings. 2019 ;[citado 2024 jun. 21 ]
Trabalho de evento
Bessel-Gauss beam description in the generalized Lorenz-Mie theory: the finite series method (2019)
Llerena Valdivia, Nereida Celina; Ambrosio, Leonardo André
Source: Proceedings. Conference titles: International Microwave and Optoelectronics Conference - IMOC. Unidade: EESC
Subjects: FEIXES ÓPTICOS, ELETROMAGNETISMO, ENGENHARIA ELÉTRICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
LLERENA VALDIVIA, Nereida Celina e AMBROSIO, Leonardo André. Bessel-Gauss beam description in the generalized Lorenz-Mie theory: the finite series method. 2019, Anais.. São Caetano do Sul, SP: SBMO, 2019. . Acesso em: 21 jun. 2024.
APA
Llerena Valdivia, N. C., & Ambrosio, L. A. (2019). Bessel-Gauss beam description in the generalized Lorenz-Mie theory: the finite series method. In Proceedings. São Caetano do Sul, SP: SBMO.
NLM
Llerena Valdivia NC, Ambrosio LA. Bessel-Gauss beam description in the generalized Lorenz-Mie theory: the finite series method. Proceedings. 2019 ;[citado 2024 jun. 21 ]
Vancouver
Llerena Valdivia NC, Ambrosio LA. Bessel-Gauss beam description in the generalized Lorenz-Mie theory: the finite series method. Proceedings. 2019 ;[citado 2024 jun. 21 ]
Artigo de periodico
Structuring light under different polarization states within micrometer domains: exact analysis from the Maxwell equations (2017)
Rached, Michel Zamboni; Ambrosio, Leonardo André ; Dorrah, Ahmed H.; Mojahedi, Mo
Source: Optics Express. Unidade: EESC
Subjects: FEIXES ÓPTICOS, FUNÇÕES DE BESSEL, ENGENHARIA ELÉTRICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
RACHED, Michel Zamboni et al. Structuring light under different polarization states within micrometer domains: exact analysis from the Maxwell equations. Optics Express, v. 25, n. 9, p. 10051-10056, 2017Tradução . . Disponível em: https://doi.org/10.1364/OE.25.010051. Acesso em: 21 jun. 2024.
APA
Rached, M. Z., Ambrosio, L. A., Dorrah, A. H., & Mojahedi, M. (2017). Structuring light under different polarization states within micrometer domains: exact analysis from the Maxwell equations. Optics Express, 25( 9), 10051-10056. doi:10.1364/OE.25.010051
NLM
Rached MZ, Ambrosio LA, Dorrah AH, Mojahedi M. Structuring light under different polarization states within micrometer domains: exact analysis from the Maxwell equations [Internet]. Optics Express. 2017 ; 25( 9): 10051-10056.[citado 2024 jun. 21 ] Available from: https://doi.org/10.1364/OE.25.010051
Vancouver
Rached MZ, Ambrosio LA, Dorrah AH, Mojahedi M. Structuring light under different polarization states within micrometer domains: exact analysis from the Maxwell equations [Internet]. Optics Express. 2017 ; 25( 9): 10051-10056.[citado 2024 jun. 21 ] Available from: https://doi.org/10.1364/OE.25.010051

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