Influence of the hydrogen content on the optical properties of TiOx thin films (2020)
- Authors:
- USP affiliated authors: TABACNIKS, MANFREDO HARRI - IF ; SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF
- Unidade: IF
- DOI: 10.1007/s10854-019-02685-z
- Subjects: FÍSICA NUCLEAR; DIFRAÇÃO POR RAIOS X; ÍONS ELETRÔNICOS; NANOELETRÔNICA
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Journal of Materials Science-Materials in Eletronics
- ISSN: 1573-482X
- Volume/Número/Paginação/Ano: v. 31, n.2, p. 1672-1680, janeiro 2020
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
AMORIN, Luís Henrique et al. Influence of the hydrogen content on the optical properties of TiOx thin films. Journal of Materials Science-Materials in Eletronics, v. 31, n. 2, p. 1672-1680, 2020Tradução . . Disponível em: https://doi.org/10.1007/s10854-019-02685-z. Acesso em: 28 dez. 2025. -
APA
Amorin, L. H., Martins, L. da S., Urbano, A., Santos, C. S. dos, Matos, R., Moro, M. V., et al. (2020). Influence of the hydrogen content on the optical properties of TiOx thin films. Journal of Materials Science-Materials in Eletronics, 31( 2), 1672-1680. doi:10.1007/s10854-019-02685-z -
NLM
Amorin LH, Martins L da S, Urbano A, Santos CS dos, Matos R, Moro MV, Silva TF da, Rodrigues C, Tabacniks MH. Influence of the hydrogen content on the optical properties of TiOx thin films [Internet]. Journal of Materials Science-Materials in Eletronics. 2020 ; 31( 2): 1672-1680.[citado 2025 dez. 28 ] Available from: https://doi.org/10.1007/s10854-019-02685-z -
Vancouver
Amorin LH, Martins L da S, Urbano A, Santos CS dos, Matos R, Moro MV, Silva TF da, Rodrigues C, Tabacniks MH. Influence of the hydrogen content on the optical properties of TiOx thin films [Internet]. Journal of Materials Science-Materials in Eletronics. 2020 ; 31( 2): 1672-1680.[citado 2025 dez. 28 ] Available from: https://doi.org/10.1007/s10854-019-02685-z - Bias and synergy in the self-consistent approach of data analysis of ion beam techniques
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Informações sobre o DOI: 10.1007/s10854-019-02685-z (Fonte: oaDOI API)
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