On the performance degradation of poly(3-hexylthiophene) field-effect transistors (2015)
- Authors:
- USP affiliated authors: SILVA, MARCELO DE ASSUMPCAO PEREIRA DA - IFSC ; FONSECA, FERNANDO JOSEPETTI - EP ; IZQUIERDO, JOSÉ ENRIQUE EIREZ - EP
- Unidades: IFSC; EP
- DOI: 10.1109/TDMR.2015.2442239
- Subjects: FILMES FINOS; TRANSISTORES
- Language: Inglês
- Imprenta:
- Publisher place: Piscataway
- Date published: 2015
- Source:
- Título: IEEE Transactions on Device and Materials Reliability
- ISSN: 1530-4388
- Volume/Número/Paginação/Ano: v. 15, n. 3, p. 342-351, Sept. 2015
- Este artigo possui versão em acesso aberto
- URL de acesso aberto
- Versão do Documento: Versão submetida (Pré-print)
-
Status: Artigo possui versão em acesso aberto em repositório (Green Open Access) -
ABNT
CAVALLARI, Marco Roberto et al. On the performance degradation of poly(3-hexylthiophene) field-effect transistors. IEEE Transactions on Device and Materials Reliability, v. 15, n. 3, p. 342-351, 2015Tradução . . Disponível em: https://doi.org/10.1109/TDMR.2015.2442239. Acesso em: 11 mar. 2026. -
APA
Cavallari, M. R., Zanchin, V. R., Valle, M. A., Eirez Izquierdo, J. E., Rodríguez, E. M., Gonzalez Rodríguez, E. F., et al. (2015). On the performance degradation of poly(3-hexylthiophene) field-effect transistors. IEEE Transactions on Device and Materials Reliability, 15( 3), 342-351. doi:10.1109/TDMR.2015.2442239 -
NLM
Cavallari MR, Zanchin VR, Valle MA, Eirez Izquierdo JE, Rodríguez EM, Gonzalez Rodríguez EF, Silva M de AP da, Fonseca FJ. On the performance degradation of poly(3-hexylthiophene) field-effect transistors [Internet]. IEEE Transactions on Device and Materials Reliability. 2015 ; 15( 3): 342-351.[citado 2026 mar. 11 ] Available from: https://doi.org/10.1109/TDMR.2015.2442239 -
Vancouver
Cavallari MR, Zanchin VR, Valle MA, Eirez Izquierdo JE, Rodríguez EM, Gonzalez Rodríguez EF, Silva M de AP da, Fonseca FJ. On the performance degradation of poly(3-hexylthiophene) field-effect transistors [Internet]. IEEE Transactions on Device and Materials Reliability. 2015 ; 15( 3): 342-351.[citado 2026 mar. 11 ] Available from: https://doi.org/10.1109/TDMR.2015.2442239 - Morphological and superficial study of thin films based on conjugated semiconductor polymer PBTTT-C14
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