Analysis of measurement procedures of EGFET devices using FTO thin films (2011)
- Authors:
- Autor USP: MULATO, MARCELO - FFCLRP
- Unidade: FFCLRP
- Subjects: BIOENGENHARIA; SENSORES BIOMÉDICOS; MEDIDAS FÍSICAS; TRANSISTORES
- Language: Português
- Imprenta:
- Source:
- Título do periódico: Livro de Resumos
- Conference titles: Encontro Nacional de Física da Matéria Condensada
-
ABNT
NASCIMENTO, Raphael Aparecido Sanches e MULATO, Marcelo. Analysis of measurement procedures of EGFET devices using FTO thin films. 2011, Anais.. São Paulo: SBF, 2011. . Acesso em: 16 abr. 2024. -
APA
Nascimento, R. A. S., & Mulato, M. (2011). Analysis of measurement procedures of EGFET devices using FTO thin films. In Livro de Resumos. São Paulo: SBF. -
NLM
Nascimento RAS, Mulato M. Analysis of measurement procedures of EGFET devices using FTO thin films. Livro de Resumos. 2011 ;[citado 2024 abr. 16 ] -
Vancouver
Nascimento RAS, Mulato M. Analysis of measurement procedures of EGFET devices using FTO thin films. Livro de Resumos. 2011 ;[citado 2024 abr. 16 ] - Extended gate field effect transistor using 'V IND.2''O IND.5' xerogel sensing membrane by sol-gel method
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