On the modelling of the C-V characteristics of semiconductor nanowire transistors (2010)
- Authors:
- Autor USP: ROMERO, MURILO ARAUJO - EESC
- Unidade: EESC
- Subjects: TRANSISTORES; EQUAÇÕES NÃO LINEARES; PROCESSOS DE POISSON
- Language: Inglês
- Imprenta:
- Publisher place: Montevideo
- Date published: 2010
- ISBN: 9789871620159
- Source:
- Título do periódico: Proceedings
- Conference titles: Argentine School of Micro-Nanoelectronics, Technology and Applications
-
ABNT
NOBREGA, Rafael Vinicius Tayette da e RAGI, Regiane e ROMERO, Murilo Araujo. On the modelling of the C-V characteristics of semiconductor nanowire transistors. 2010, Anais.. Montevideo: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2010. Disponível em: http://ieeexplore.ieee.org/stamp/stamp.do?tp=&arnumber=5606376. Acesso em: 23 abr. 2024. -
APA
Nobrega, R. V. T. da, Ragi, R., & Romero, M. A. (2010). On the modelling of the C-V characteristics of semiconductor nanowire transistors. In Proceedings. Montevideo: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de http://ieeexplore.ieee.org/stamp/stamp.do?tp=&arnumber=5606376 -
NLM
Nobrega RVT da, Ragi R, Romero MA. On the modelling of the C-V characteristics of semiconductor nanowire transistors [Internet]. Proceedings. 2010 ;[citado 2024 abr. 23 ] Available from: http://ieeexplore.ieee.org/stamp/stamp.do?tp=&arnumber=5606376 -
Vancouver
Nobrega RVT da, Ragi R, Romero MA. On the modelling of the C-V characteristics of semiconductor nanowire transistors [Internet]. Proceedings. 2010 ;[citado 2024 abr. 23 ] Available from: http://ieeexplore.ieee.org/stamp/stamp.do?tp=&arnumber=5606376 - Analysis of a proposed dropping filter for WDM systems
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