Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region (2008)
- Authors:
- USP affiliated authors: NASCIMENTO, IVAN CUNHA - IF ; SANADA, EDSON KENZO - IF ; ELIZONDO, JUAN IRABURU - IF ; KUZNETSOV, YURII - IF ; GALVAO, RICARDO MAGNUS OSORIO - IF
- Unidade: IF
- Assunto: TOKAMAKS
- Language: Inglês
- Imprenta:
- Publisher: The Institute
- Publisher place: New York
- Date published: 2008
- Source:
- Título do periódico: AIP Conference Proceedings
- ISSN: 0094-243X
- Volume/Número/Paginação/Ano: v. 996, p. 235-240, 2008
- Conference titles: IAEA Techinical Meeting on Research Using Small Fusion Devices
-
ABNT
MACHIDA, Munemasa et al. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region. AIP Conference Proceedings. New York: The Institute. Disponível em: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal. Acesso em: 19 set. 2024. , 2008 -
APA
Machida, M., Daltrini, A. M., Severo, J. H., Nascimento, I. C., Sanada, E. K., Elizondo, J. I., et al. (2008). Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region. AIP Conference Proceedings. New York: The Institute. Recuperado de http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal -
NLM
Machida M, Daltrini AM, Severo JH, Nascimento IC, Sanada EK, Elizondo JI, Kuznetsov YK, Galvao RMO. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region [Internet]. AIP Conference Proceedings. 2008 ; 996 235-240.[citado 2024 set. 19 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal -
Vancouver
Machida M, Daltrini AM, Severo JH, Nascimento IC, Sanada EK, Elizondo JI, Kuznetsov YK, Galvao RMO. Spectral line profile analysis using higher diffraction order in vacuum ultraviolet region [Internet]. AIP Conference Proceedings. 2008 ; 996 235-240.[citado 2024 set. 19 ] Available from: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000996000001000235000001&idtype=cvips&prog=normal - Comparative analysis of VUV spectral emissions from NOVA-UNICAMP and TCABR-USP tokamak.
- Analysis of impurity line emissions using VUV spectrometer in TCABR-USP tokamak
- Impurity line emissions in VUV region of TCABR Tokamak
- Measurements of temporal profile of toroidal rotation velocity of carbon impurities in the TCABR tokamak
- New method for temporal evolution of plasma rotation velocity in high-temperature plasma confinement devises
- Error analysis in the electron temperature measurements in TCABR
- VUV spectral line emission measurements in the TCABR Tokamak
- Recent results on biased electrode in TCABR
- Investigation of the dependence of H-alpha emission on the poloidal position of gas pu±n in the TCABR Tokamak
- Suppression and excitation of MHD activity with an electrically polarized electrode at the TCABR tokamak plasma edge
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