Effect of MeV Si Ion bombardment on thermoelectric characteristics of sequentially deposited SiO2/AuxSiO2(1-x) nanolayrers (2006)
- Authors:
- Autor USP: ZIMMERMAN, ROBERT LEE - FFCLRP
- Unidade: FFCLRP
- Assunto: TERMOELETRICIDADE
- Language: Inglês
- Imprenta:
- Publisher: MRS
- Publisher place: San Francisco
- Date published: 2006
- Source:
- Título: Abstracts
- Conference titles: Spring Meeting on The Materials Research Society
-
ABNT
BUDAK, S. et al. Effect of MeV Si Ion bombardment on thermoelectric characteristics of sequentially deposited SiO2/AuxSiO2(1-x) nanolayrers. 2006, Anais.. San Francisco: MRS, 2006. . Acesso em: 24 jan. 2026. -
APA
Budak, S., Zheng, B., Muntele, C., Xiao, Z., Muntele, I., Chhay, B., & Zimmerman, R. L. (2006). Effect of MeV Si Ion bombardment on thermoelectric characteristics of sequentially deposited SiO2/AuxSiO2(1-x) nanolayrers. In Abstracts. San Francisco: MRS. -
NLM
Budak S, Zheng B, Muntele C, Xiao Z, Muntele I, Chhay B, Zimmerman RL. Effect of MeV Si Ion bombardment on thermoelectric characteristics of sequentially deposited SiO2/AuxSiO2(1-x) nanolayrers. Abstracts. 2006 ;[citado 2026 jan. 24 ] -
Vancouver
Budak S, Zheng B, Muntele C, Xiao Z, Muntele I, Chhay B, Zimmerman RL. Effect of MeV Si Ion bombardment on thermoelectric characteristics of sequentially deposited SiO2/AuxSiO2(1-x) nanolayrers. Abstracts. 2006 ;[citado 2026 jan. 24 ] - Fabrication of optical channel waveguides in 'GA''AS' / 'AL''GA''AS' system by mev ion beam bemordment
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- Concentration profiling of various polymers using elastic recoil detection, narrow resonance scattering, and rutherford backscattering spectroscopy
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