Comparing two electrical impedance tomography algorithms: Gauss-Newton and topology optimization (2006)
- Authors:
- USP affiliated authors: SILVA, EMILIO CARLOS NELLI - EP ; LIMA, RAÚL GONZÁLEZ - EP ; NAN, PAI CHI - EP
- Unidade: EP
- DOI: 10.1117/12.654059
- Subjects: IMAGEAMENTO (BIOENGENHARIA); TOMOGRAFIA; TOPOLOGIA (OTIMIZAÇÃO); MÉTODO DOS ELEMENTOS FINITOS
- Language: Inglês
- Imprenta:
- Publisher place: Bellingham
- Date published: 2006
- Source:
- Título: Proceedings of SPIE - The International Society for Optical Engineering
- Volume/Número/Paginação/Ano: v. 6143, p. 1-11, 2006
- Conference titles: Medical Imaging 2006 : physiology, function, and structure from medical images
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
MELLO, Luís Augusto Motta et al. Comparing two electrical impedance tomography algorithms: Gauss-Newton and topology optimization. Proceedings of SPIE - The International Society for Optical Engineering. Bellingham: Escola Politécnica, Universidade de São Paulo. Disponível em: https://doi.org/10.1117/12.654059. Acesso em: 24 jan. 2026. , 2006 -
APA
Mello, L. A. M., Lima, C. R. de, Ceballos Aya, J. C., Chi Nan, P., Moura, F. S. de, Silva, E. C. N., & González Lima, R. (2006). Comparing two electrical impedance tomography algorithms: Gauss-Newton and topology optimization. Proceedings of SPIE - The International Society for Optical Engineering. Bellingham: Escola Politécnica, Universidade de São Paulo. doi:10.1117/12.654059 -
NLM
Mello LAM, Lima CR de, Ceballos Aya JC, Chi Nan P, Moura FS de, Silva ECN, González Lima R. Comparing two electrical impedance tomography algorithms: Gauss-Newton and topology optimization [Internet]. Proceedings of SPIE - The International Society for Optical Engineering. 2006 ; 6143 1-11.[citado 2026 jan. 24 ] Available from: https://doi.org/10.1117/12.654059 -
Vancouver
Mello LAM, Lima CR de, Ceballos Aya JC, Chi Nan P, Moura FS de, Silva ECN, González Lima R. Comparing two electrical impedance tomography algorithms: Gauss-Newton and topology optimization [Internet]. Proceedings of SPIE - The International Society for Optical Engineering. 2006 ; 6143 1-11.[citado 2026 jan. 24 ] Available from: https://doi.org/10.1117/12.654059 - A black-box back-projection algorithm for electrical impedance tomography
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Informações sobre o DOI: 10.1117/12.654059 (Fonte: oaDOI API)
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