Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG RODS (2004)
- Authors:
- Nunes, A. R. - Universidade Estadual de Maringá (UEM)
- Rohling, J. H. - Universidade Estadual de Maringá (UEM)
- Medina, A. N. - Universidade Estadual de Maringá (UEM)
- Pereira, J. R. D. - Universidade Estadual de Maringá (UEM)
- Bento, A. C. - Universidade Estadual de Maringá (UEM)
- Baesso, Mauro Luciano - Universidade Estadual de Maringá (UEM)
- Nunes, Luiz Antônio de Oliveira
- Catunda, Tomaz
- USP affiliated authors: NUNES, LUIZ ANTONIO DE OLIVEIRA - IFSC ; CATUNDA, TOMAZ - IFSC
- Unidade: IFSC
- Subjects: MATERIAIS; LENTES; LASER
- Language: Inglês
- Imprenta:
- Publisher: Instituto Nacional de Pesquisas Espaciais - INPE
- Publisher place: São José dos Campos
- Date published: 2004
- Source:
- Título do periódico: Abstracts
- Volume/Número/Paginação/Ano: São José dos Campos: Instituto Nacional de Pesquisas Espaciais, 2004
- Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP
-
ABNT
NUNES, A. R. et al. Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG RODS. 2004, Anais.. São José dos Campos: Instituto Nacional de Pesquisas Espaciais - INPE, 2004. . Acesso em: 13 ago. 2024. -
APA
Nunes, A. R., Rohling, J. H., Medina, A. N., Pereira, J. R. D., Bento, A. C., Baesso, M. L., et al. (2004). Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG RODS. In Abstracts. São José dos Campos: Instituto Nacional de Pesquisas Espaciais - INPE. -
NLM
Nunes AR, Rohling JH, Medina AN, Pereira JRD, Bento AC, Baesso ML, Nunes LA de O, Catunda T. Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG RODS. Abstracts. 2004 ;[citado 2024 ago. 13 ] -
Vancouver
Nunes AR, Rohling JH, Medina AN, Pereira JRD, Bento AC, Baesso ML, Nunes LA de O, Catunda T. Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG RODS. Abstracts. 2004 ;[citado 2024 ago. 13 ] - Eletroscopio de alta sensibilidade
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